Near-field imaging of out-of-plane light scattering in photonic crystal slabs

Valentyn Volkov, Sergey Bozhevolnyi, Dirk Taillaert

    Research output: Contribution to journalConference article in JournalResearchpeer-review

    Abstract

    A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.
    Original languageEnglish
    Book seriesProceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)
    Volume5118
    Pages (from-to)541-548
    Number of pages8
    ISSN0277-786X
    DOIs
    Publication statusPublished - 2003

    Cite this

    @inproceedings{610185e3fb0b4f28a3224c7046fc2ddf,
    title = "Near-field imaging of out-of-plane light scattering in photonic crystal slabs",
    abstract = "A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.",
    author = "Valentyn Volkov and Sergey Bozhevolnyi and Dirk Taillaert",
    year = "2003",
    doi = "10.1117/12.498756",
    language = "English",
    volume = "5118",
    pages = "541--548",
    journal = "Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)",
    issn = "0277-786X",
    publisher = "Society of Photo-optical Instrumentation Engineers",

    }

    Near-field imaging of out-of-plane light scattering in photonic crystal slabs. / Volkov, Valentyn; Bozhevolnyi, Sergey; Taillaert, Dirk.

    In: Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE), Vol. 5118, 2003, p. 541-548.

    Research output: Contribution to journalConference article in JournalResearchpeer-review

    TY - GEN

    T1 - Near-field imaging of out-of-plane light scattering in photonic crystal slabs

    AU - Volkov, Valentyn

    AU - Bozhevolnyi, Sergey

    AU - Taillaert, Dirk

    PY - 2003

    Y1 - 2003

    N2 - A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

    AB - A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

    U2 - 10.1117/12.498756

    DO - 10.1117/12.498756

    M3 - Conference article in Journal

    VL - 5118

    SP - 541

    EP - 548

    JO - Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)

    JF - Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)

    SN - 0277-786X

    ER -