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Abstract
Power electronic converters are essential in modern electrical and electronic applications, necessitating the study on power electronic reliability for dependable design and operation. In earlier research on power electronic reliability, the mission profiles have been mapped to thermal stresses and lifetimes, while its applications are generally focused on steady-state scenarios. It turns out to be time-consuming and inefficient to repeat the entire procedures for addressing the impact of stress variances or model uncertainties. In this context, this article defines the sensitivity for power electronic reliability and provides a sensitivity-based perspective on system optimization, where the concept is formulated through two steps accounting for thermal stresses and lifetime respectively. The applications of sensitivities for thermal stresses and lifetime are demonstrated, which serve as identifiers of critical factors and quantitative metrics of marginal performances. Upon this, possibilities are also emerging for enhancing the cost-effectiveness of reliability validations and encompassing model robustness into reliability analysis and prediction.
Original language | English |
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Article number | 10842466 |
Journal | IEEE Transactions on Power Electronics |
Volume | 40 |
Issue number | 5 |
Pages (from-to) | 7251 - 7260 |
Number of pages | 10 |
ISSN | 1941-0107 |
DOIs | |
Publication status | E-pub ahead of print - Jan 2025 |
Bibliographical note
Publisher Copyright:© 2025 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.
Keywords
- Junctions
- Measurement
- Power electronics
- Power system reliability
- Reliability
- Reliability engineering
- Semiconductor device modeling
- Stress
- Thermal stresses
- Uncertainty
- sensitivity analysis
- reliability
- lifetime
- converters
- thermal stresses
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Dive into the research topics of 'On the Sensitivity Analysis in Reliability Evaluation for Power Electronic Converters'. Together they form a unique fingerprint.Projects
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Reliability and Lifetime Analysis for Electronic Components
Blaabjerg, F. (PI), Wang, H. (CoI), Song, Y. (Project Participant), Zhang, K. (Project Participant) & Frøstrup, S. (Project Coordinator)
23/03/2022 → 31/03/2025
Project: Research