Online Vce measurement method for wear-out monitoring of high power IGBT modules

Szymon Beczkowski, Pramod Ghimire, Angel Ruiz de Vega, Stig Munk-Nielsen, Bjørn Rannestad, Paul Thøgersen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

147 Citations (Scopus)
3166 Downloads (Pure)

Abstract

A simple Vce online monitoring circuit is presented in this paper. It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connected diodes to sense the Vce voltage with millivolt accuracy. One diode acts as a protection to block high DC voltage present on input terminals. When the device is conducting the voltage on the second diode is measured to compensate for the voltage drop on the protection diode thus eliminating voltage offset due to diodes' forward voltage temperature dependency. Using four diodes one can monitor voltages on all power devices in a converter leg.
Original languageEnglish
Title of host publicationProceedings of the 15th European Conference on Power Electronics and Applications, EPE 2013
Number of pages7
PublisherIEEE Press
Publication date2013
ISBN (Print)9781479901159
ISBN (Electronic)9781479901142, 978-147990116-6
DOIs
Publication statusPublished - 2013
EventEuropean Conference on Power Electronics and Applications, EPE 2013 - Lille, France
Duration: 3 Sept 20135 Sept 2013
http://www.epe2013.com/

Conference

ConferenceEuropean Conference on Power Electronics and Applications, EPE 2013
Country/TerritoryFrance
CityLille
Period03/09/201305/09/2013
Internet address

Keywords

  • Measurement
  • Reliability
  • IGBT
  • Diode
  • Ageing

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