Abstract
This paper proposes an optimal defect shape to increase the sensitivity of a MEMS cantilever based piezo resistive sensor. This work describes the sensitivity improvement using Stress concentration region (SCR) introduced in the cantilever beam. The SCR improves the surface stress on the cantilever beam and enhances the sensitivity of the sensor. A particular defect (sigma star) is introduced which is designed and place in a way that increases the sensitivity by about 20%.
Original language | English |
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Title of host publication | 2016 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 |
Number of pages | 5 |
Publisher | Electrical Engineering/Electronics, Computer, Communications and Information Technology Association |
Publication date | 19 Dec 2016 |
Pages | 136-140 |
Article number | 7791242 |
ISBN (Electronic) | 9781509040599 |
DOIs | |
Publication status | Published - 19 Dec 2016 |
Externally published | Yes |
Event | 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 - Islamabad, Pakistan Duration: 1 Nov 2016 → 2 Nov 2016 |
Conference
Conference | 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 |
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Country/Territory | Pakistan |
City | Islamabad |
Period | 01/11/2016 → 02/11/2016 |
Sponsor | Higher Education Commission Pakistan (HEC), Ministry of Sciences and Technology (MoST), National University of Sciences and Technology (NUST) |
Keywords
- Finite Element Analysis
- MEMS
- Optimal Sensor
- Stress Concentration region