Power Electronics Reliability: State of the Art and Outlook

Huai Wang; Frede Blaabjerg

doi:10.1109/JESTPE.2020.3037161

Power Electronics Reliability: State of the Art and Outlook

Huai Wang, Frede Blaabjerg

Research output: Contribution to journal › Journal article › Research › peer-review

111 Citations (Scopus)

1030 Downloads (Pure)

Abstract

This paper aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g. Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes, in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.

Original language	English
Article number	9253639
Journal	IEEE Journal of Emerging and Selected Topics in Power Electronics
Volume	9
Issue number	6
Pages (from-to)	6476-6493
Number of pages	18
ISSN	2168-6777
DOIs	https://doi.org/10.1109/JESTPE.2020.3037161
Publication status	Published - Dec 2021

Keywords

Power electronics
failure mechanism
reliability prediction
physics-of-degradation
accelerated degradation testing
control
condition monitoring

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10.1109/JESTPE.2020.3037161Licence: CC BY 4.0

JESTPE-2020-04-0388_accepted versionAccepted author manuscript, 25.4 MBLicence: CC BY 4.0
Open Access versionFinal published version, 4.24 MBLicence: CC BY 4.0

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APETT: Advanced Power Electronic Technology and Tools
Blaabjerg, F. (PI), Munk-Nielsen, S. (CoI), Iannuzzo, F. (Project Participant), Wang, H. (Project Participant), Uhrenfeldt, C. (Project Participant), Beczkowski, S. (Project Participant), Zhou, D. (Project Participant), Choi, U. (Project Participant), Jørgensen, A. B. (Project Participant), Vernica, I. (Project Participant), Sangwongwanich, A. (Project Participant), Christensen, N. (Project Participant), Ceccarelli, L. (Project Participant), Nielsen, C. K. (Project Participant), Bahman, A. S. (Project Participant), Pedersen, K. (Project Participant), Pedersen, K. B. (Project Participant) & Kristensen, P. K. (Project Participant)
Innovation Fund Denmark
01/01/2017 → 30/06/2021
Project: Research

Cite this

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abstract = "This paper aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g. Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes, in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.",

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KW - reliability prediction

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KW - accelerated degradation testing

KW - control

KW - condition monitoring

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Power Electronics Reliability: State of the Art and Outlook

Abstract

Keywords

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Projects

APETT: Advanced Power Electronic Technology and Tools

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