Power Electronics Reliability: State of the Art and Outlook

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Abstract

This paper aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g. Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes, in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.
Original languageEnglish
JournalIEEE Journal of Emerging and Selected Topics in Power Electronics
ISSN2168-6777
Publication statusE-pub ahead of print - 2021

Keywords

  • Power electronics
  • failure mechanism
  • reliability prediction
  • physics-of-degradation
  • accelerated degradation testing
  • control
  • condition monitoring

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