Projects per year
Abstract
This paper aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g. Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes, in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.
| Original language | English |
|---|---|
| Article number | 9253639 |
| Journal | IEEE Journal of Emerging and Selected Topics in Power Electronics |
| Volume | 9 |
| Issue number | 6 |
| Pages (from-to) | 6476-6493 |
| Number of pages | 18 |
| ISSN | 2168-6777 |
| DOIs | |
| Publication status | Published - Dec 2021 |
Keywords
- Power electronics
- failure mechanism
- reliability prediction
- physics-of-degradation
- accelerated degradation testing
- control
- condition monitoring
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Dive into the research topics of 'Power Electronics Reliability: State of the Art and Outlook'. Together they form a unique fingerprint.Projects
- 1 Finished
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APETT: Advanced Power Electronic Technology and Tools
Blaabjerg, F., Munk-Nielsen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C., Beczkowski, S. M., Zhou, D., Choi, U., Jørgensen, A. B., Vernica, I., Sangwongwanich, A., Christensen, N., Ceccarelli, L., Nielsen, C. K., Bahman, A. S., Pedersen, K., Pedersen, K. B. & Kristensen, P. K.
01/01/2017 → 30/06/2021
Project: Research