Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen; Jan Østergaard; Torben Larsen

doi:10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen, Jan Østergaard, Torben Larsen

Department of Electronic Systems

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)
Publisher	IEEE Signal Processing Society
Publication date	14 Dec 2015
Pages	418 - 422
ISBN (Electronic)	978-1-4799-7591-4
DOIs	https://doi.org/10.1109/GlobalSIP.2015.7418229
Publication status	Published - 14 Dec 2015
Event	3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) - Orlando, FL, United States Duration: 14 Dec 2015 → 16 Dec 2015

Conference

Conference	3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)
Country/Territory	United States
City	Orlando, FL
Period	14/12/2015 → 16/12/2015

Series	IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

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10.1109/GlobalSIP.2015.7418229

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Pedersen, Patrick Steffen ; Østergaard, Jan ; Larsen, Torben. / Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. pp. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).

@inproceedings{a16ebda86a484f038b5268eeec4b2278,

title = "Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy",

author = "Pedersen, {Patrick Steffen} and Jan {\O}stergaard and Torben Larsen",

year = "2015",

month = dec,

day = "14",

doi = "10.1109/GlobalSIP.2015.7418229",

language = "English",

series = "IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings",

publisher = "IEEE Signal Processing Society",

pages = "418 -- 422",

booktitle = "2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)",

address = "United States",

note = "3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) ; Conference date: 14-12-2015 Through 16-12-2015",

}

Pedersen, PS, Østergaard, J & Larsen, T 2015, Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. in 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings, pp. 418 - 422, 3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015), Orlando, FL, United States, 14/12/2015. https://doi.org/10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. / Pedersen, Patrick Steffen; Østergaard, Jan ; Larsen, Torben.
2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. p. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

AU - Pedersen, Patrick Steffen

AU - Østergaard, Jan

AU - Larsen, Torben

PY - 2015/12/14

Y1 - 2015/12/14

U2 - 10.1109/GlobalSIP.2015.7418229

DO - 10.1109/GlobalSIP.2015.7418229

M3 - Article in proceeding

T3 - IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

SP - 418

EP - 422

BT - 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)

PB - IEEE Signal Processing Society

T2 - 3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)

Y2 - 14 December 2015 through 16 December 2015

ER -

Pedersen PS, Østergaard J , Larsen T. Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. In 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society. 2015. p. 418 - 422. (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings). doi: 10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

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FastAFM: Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing

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Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Conference

Access to Document

AUB Link

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Projects

FastAFM: Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing

Cite this