Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen, Jan Østergaard, Torben Larsen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)
PublisherIEEE Signal Processing Society
Publication date14 Dec 2015
Pages418 - 422
ISBN (Electronic)978-1-4799-7591-4
DOIs
Publication statusPublished - 14 Dec 2015
Event3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) - Orlando, FL, United States
Duration: 14 Dec 201516 Dec 2015

Conference

Conference3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)
CountryUnited States
CityOrlando, FL
Period14/12/201516/12/2015
SeriesIEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

Cite this

Pedersen, P. S., Østergaard, J., & Larsen, T. (2015). Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. In 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP) (pp. 418 - 422). IEEE Signal Processing Society. IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings https://doi.org/10.1109/GlobalSIP.2015.7418229