Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)
PublisherIEEE Signal Processing Society
Publication date14 Dec 2015
Pages418 - 422
ISBN (Electronic)978-1-4799-7591-4
DOIs
Publication statusPublished - 14 Dec 2015
Event3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) - Orlando, FL, United States
Duration: 14 Dec 201516 Dec 2015

Conference

Conference3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)
CountryUnited States
CityOrlando, FL
Period14/12/201516/12/2015
SeriesIEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

Cite this

Pedersen, P. S., Østergaard, J., & Larsen, T. (2015). Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. In 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP) (pp. 418 - 422). IEEE Signal Processing Society. IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings https://doi.org/10.1109/GlobalSIP.2015.7418229
Pedersen, Patrick Steffen ; Østergaard, Jan ; Larsen, Torben. / Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. pp. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).
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title = "Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy",
author = "Pedersen, {Patrick Steffen} and Jan {\O}stergaard and Torben Larsen",
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booktitle = "2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)",
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Pedersen, PS, Østergaard, J & Larsen, T 2015, Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. in 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings, pp. 418 - 422, 3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015), Orlando, FL, United States, 14/12/2015. https://doi.org/10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. / Pedersen, Patrick Steffen; Østergaard, Jan; Larsen, Torben.

2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. p. 418 - 422.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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AU - Larsen, Torben

PY - 2015/12/14

Y1 - 2015/12/14

U2 - 10.1109/GlobalSIP.2015.7418229

DO - 10.1109/GlobalSIP.2015.7418229

M3 - Article in proceeding

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EP - 422

BT - 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)

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Pedersen PS, Østergaard J, Larsen T. Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. In 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society. 2015. p. 418 - 422. (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings). https://doi.org/10.1109/GlobalSIP.2015.7418229