@inproceedings{e42ad01c7e8346cda184322016efe19d,
title = "Prediction of Potential-Induced Degradation Rate of Thin-Film Modules in the Field Based on Coulombs Transferred",
abstract = "We validated the use of coulombs transferred between the active cell circuit and ground as an index for quantitatively predicting degradation rate in the field for two thin-film module types undergoing potential-induced degradation (PID). The dependence was determined by comparing the degradation rate and leakage current in the field (Cocoa, Florida) to accelerated tests (85°C, 85% relative humidity), both with the application of -1,000 V bias to the cell circuit. The two module types, which degraded about 4% and 11% in power after application of 96 h of bias in chamber, degraded 5% in the field by PID within 200 days and 6 days, respectively. The signatures of PID in the thin-film modules by electroluminescence, photoluminescence, and thermography are shown so that PID in fielded thin-film modules can be identified.",
keywords = "acceleration factor, CdTe, photovoltaic modules, PID, potential-induced degradation, prediction, thin film",
author = "Peter Hacke and Steve Johnston and Wei Luo and Sergiu Spataru and Ryan Smith and Ingrid Repins",
year = "2018",
month = jun,
doi = "10.1109/PVSC.2018.8547480",
language = "English",
isbn = "978-1-5386-8530-3",
series = "I E E E Photovoltaic Specialists Conference. Conference Record",
publisher = "IEEE",
pages = "3801--3806",
booktitle = "Proceedings of the 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)",
address = "United States",
note = "7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",
}