Present and Absent Sets: Abstraction for Data Intensive Systems Suited for Testing

Research output: Contribution to journalConference article in JournalResearchpeer-review

Original languageEnglish
JournalElectronic Notes in Theoretical Computer Science
Volume264
Issue number3
Pages (from-to)53-68
ISSN1571-0661
DOIs
Publication statusPublished - 28 Dec 2010
EventDoctoral Symposium  on Systems Software Verification (DS SSV09) Real  Software, Real Problems, Real Solutions (SSV) - Aachem, Germany
Duration: 22 Jun 200924 Jun 2009
Conference number: 4

Conference

ConferenceDoctoral Symposium  on Systems Software Verification (DS SSV09) Real  Software, Real Problems, Real Solutions (SSV)
Number4
CountryGermany
CityAachem
Period22/06/200924/06/2009

Keywords

  • Testing
  • Data Intensive Systems
  • Abstract Interpretation
  • Model Checking

Cite this

@inproceedings{ed8b0830fdc511de9a61000ea68e967b,
title = "Present and Absent Sets: Abstraction for Data Intensive Systems Suited for Testing",
keywords = "Testing, Data Intensive Systems, Abstract Interpretation, Model Checking, Testing, Data Intensive Systems, Abstract Interpretation, Model Checking",
author = "Petur Olsen and Larsen, {Kim Guldstrand} and Marius Mikucionis and Arne Skou",
year = "2010",
month = "12",
day = "28",
doi = "10.1016/j.entcs.2010.12.014",
language = "English",
volume = "264",
pages = "53--68",
journal = "Electronic Notes in Theoretical Computer Science",
issn = "1571-0661",
publisher = "Elsevier",
number = "3",

}

Present and Absent Sets : Abstraction for Data Intensive Systems Suited for Testing. / Olsen, Petur; Larsen, Kim Guldstrand; Mikucionis, Marius; Skou, Arne.

In: Electronic Notes in Theoretical Computer Science, Vol. 264, No. 3, 28.12.2010, p. 53-68.

Research output: Contribution to journalConference article in JournalResearchpeer-review

TY - GEN

T1 - Present and Absent Sets

T2 - Abstraction for Data Intensive Systems Suited for Testing

AU - Olsen, Petur

AU - Larsen, Kim Guldstrand

AU - Mikucionis, Marius

AU - Skou, Arne

PY - 2010/12/28

Y1 - 2010/12/28

KW - Testing

KW - Data Intensive Systems

KW - Abstract Interpretation

KW - Model Checking

KW - Testing

KW - Data Intensive Systems

KW - Abstract Interpretation

KW - Model Checking

U2 - 10.1016/j.entcs.2010.12.014

DO - 10.1016/j.entcs.2010.12.014

M3 - Conference article in Journal

VL - 264

SP - 53

EP - 68

JO - Electronic Notes in Theoretical Computer Science

JF - Electronic Notes in Theoretical Computer Science

SN - 1571-0661

IS - 3

ER -