Protection Scheme for Modular Multilevel Converters under Diode Open-Circuit Faults

Fujin Deng, Rongwu Zhu, Dong Liu, Yanbo Wang, Huai Wang, Zhe Chen, Ming Cheng

Research output: Contribution to journalJournal articleResearchpeer-review

35 Citations (Scopus)
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Abstract

The modular multilevel converter (MMC) is attractive for medium- or high-power applications because of the advantages of its high modularity, availability, and high power quality. Reliability is one of the most important challenges for the MMC consisting of a large number of power electronic devices. The diode open-circuit fault in the submodule (SM) is an important issue for the MMC, which would affect the performance of the MMC and disrupt the operation of the MMC. This paper analyzes the impact of diode open-circuit failures in the SMs on the performance of the MMC and proposes a protection scheme for the MMC under diode open-circuit faults. The proposed protection scheme not only can effectively eliminate the possible caused high voltage due to the diode open-circuit fault but also can quickly detect the faulty SMs, which effectively avoids the destruction and protects the MMC. The proposed protection scheme is verified with a downscale MMC prototype in the laboratory. The results confirm the effectiveness of the proposed protection scheme for the MMC under diode open-circuit faults.
Original languageEnglish
Article number7922575
JournalI E E E Transactions on Power Electronics
Volume33
Issue number4
Pages (from-to)2866 - 2877
Number of pages12
ISSN0885-8993
DOIs
Publication statusPublished - Apr 2018

Keywords

  • Diode faults
  • Modular multilevel converters (MMCs)
  • Open-circuit fault
  • Protection

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