PSpice Modeling Platform for SiC Power MOSFET Modules with Extensive Experimental Validation

Lorenzo Ceccarelli, Francesco Iannuzzo, Muhammad Nawaz

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

15 Citations (Scopus)
1848 Downloads (Pure)

Abstract

The aim of this work is to present a PSpice implementation for a well-established and compact physics-based SiC MOSFET model, including a fast, experimental-based parameter extraction procedure in a MATLAB GUI environment. The model, originally meant for single-die devices, has been used to simulate the performance of high current rating (above 100 A), multi-chip SiC MOSFET modules both for static and switching behavior. Therefore, the simulation results have been validated experimentally in a wide range of operating conditions, including high temperatures, gate resistance and stray elements. The whole process has been repeated for three different modules with voltage rating of 1.2 kV and 1.7 kV, manufactured by three different companies. Lastly, a parallel connection of two modules of the same type has been performed in order to observe the unbalancing and mismatches experimentally, and to verify the model effectiveness in such challenging topologies.
Original languageEnglish
Title of host publicationProceedings of 8th IEEE Energy Conversion Congress and Exposition, 2016: ECCE 2016
Number of pages8
PublisherIEEE Press
Publication dateSept 2016
ISBN (Electronic)978-1-5090-0737-0
DOIs
Publication statusPublished - Sept 2016
Event 8th Annual IEEE Energy Conversion Congress & Exposition: ECCE 2016 - Milwaukee, WI, United States
Duration: 18 Sept 201622 Sept 2016
http://www.ieee-ecce.org/

Conference

Conference 8th Annual IEEE Energy Conversion Congress & Exposition
Country/TerritoryUnited States
CityMilwaukee, WI
Period18/09/201622/09/2016
SponsorIEEE, IEEE Industry Applications Society (IAS), IEEE Power Electronics and Industry Applications Societies (PELS)
Internet address

Keywords

  • PSpice
  • Modeling and simulation
  • SiC MOSFET
  • Wide band gap devices
  • Parameter identification

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