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Abstract
We demonstrate a method to quantify the extent of solar cell cracks, shunting, or damaged cell interconnects, present in crystalline silicon photovoltaic (PV) modules by statistical analysis of the electroluminescence (EL) intensity distributions of individual cells within the module. From the EL intensity distributions (ELID) of each cell, we calculated summary statistics such as standard deviation, median, skewness and kurtosis, and analyzed how they correlate with the magnitude of the solar cell degradation. We found that the dispersion of the ELID increases with the size and severity of the solar cell cracks, correlating with an increase in standard deviation and decrease in kurtosis. For shunted cells, we found that the ELID median is strongly correlated with the extent of cell shunting. Last, cells with damaged interconnect ribbons show current crowding and increased series resistance regions, characterized by increased dispersion and skewness of the ELID. These cell-level diagnostic parameters can be used quantify the level of mismatch between the solar cells in the module, which can represent the extent of the module degradation, due to transportation, installation, or field operation. The method can be easily automated for quality control by module manufacturers or installers, or as a diagnostic tool by plant operators and diagnostic service providers.
Original language | English |
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Title of host publication | Proceedings of the 33rd European Photovoltaic Solar Energy Conference and Exhibition |
Number of pages | 7 |
Publisher | WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG |
Publication date | 2017 |
Pages | 1466-1472 |
ISBN (Print) | 3-936338-47-7 |
DOIs | |
Publication status | Published - 2017 |
Event | 33rd European Photovoltaic Solar Energy Conference and Exhibition - RAI Convention & Exhibition Centre, Amsterdam, Netherlands Duration: 25 Sept 2017 → 29 Sept 2017 Conference number: 33 https://www.photovoltaic-conference.com/ |
Conference
Conference | 33rd European Photovoltaic Solar Energy Conference and Exhibition |
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Number | 33 |
Location | RAI Convention & Exhibition Centre |
Country/Territory | Netherlands |
City | Amsterdam |
Period | 25/09/2017 → 29/09/2017 |
Internet address |
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Dive into the research topics of 'Quantification of Solar Cell Failure Signatures Based on Statistical Analysis of Electroluminescence Images'. Together they form a unique fingerprint.Projects
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DronEL - Fast and accurate inspection of large photovoltaic plants using aerial drone imaging
Séra, D., Spataru, S. V. & Parikh, H. R.
01/01/2017 → 31/12/2019
Project: Research