Reliability Analysis of Fast Electric Vehicle Charging Systems

Jayani Karunarathna*, Udaya Madawala, Craig Baguley, Frede Blaabjerg, Monika Sandelic

*Corresponding author for this work

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Abstract

To improve electric vehicle (EV) uptake, fast charging systems must be widely deployed. However, fast EV charging mission profiles expose power electronic components to extremely high-power stresses within short periods of time.
Consequently, power electronic components in fast EV charging systems are expected to degrade/wear-out at a faster rate, requiring frequent replacement within the lifespan of the charging system. It is, therefore, important to both design and build fast EV charging systems with a known level of reliability.
This paper proposes a model to investigate the reliability of fast EV charging systems. Using the model, the reliability of a typical fast EV charging system is analyzed, and results are presented to show how the lifetime and reliability of semiconductor switches used in fast EV charging systems can be predicted, even under widely varying mission profiles.
Original languageEnglish
Title of host publication2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)
Number of pages6
PublisherIEEE Press
Publication date2021
Pages1607-1612
Article number9479384
ISBN (Print)978-1-7281-6345-1
ISBN (Electronic)978-1-7281-6344-4
DOIs
Publication statusPublished - 2021
Event 2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia) - , Singapore
Duration: 24 May 202127 May 2021

Conference

Conference 2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)
Country/TerritorySingapore
Period24/05/202127/05/2021

Keywords

  • Mission Profile
  • Reliability
  • Lifetime
  • Semiconductor switches
  • Fast electric vehicle charging systems

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