Reliability Assessment of Single-phase PV Inverters

Saeed Peyghami; Pooya Davari; Frede Blaabjerg; Ahmed Abdelhakim

Reliability Assessment of Single-phase PV Inverters

Saeed Peyghami, Pooya Davari, Frede Blaabjerg, Ahmed Abdelhakim

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

7 Citations (Scopus)

142 Downloads (Pure)

Abstract

This paper investigates the reliability of two types of single-phase Photo-Voltaic (PV)inverters, which are a quasi-Z-Source Inverter (qZSI)and a conventional two-stage boost-based inverter. The converters reliability is estimated by employing a mission-profile based reliability assessment approach modeling the wear-out failure of fragile components, i.e., capacitors and semiconductor devices. The obtained results reveal that the conventional two-stage inverter has better reliability compared to the qZSI due to the higher voltage and current stresses on qZSI components. Furthermore, the impact of PV array configuration on the Shoot Through (ST)state of the qZSI and consequently on its reliability is illustrated. The analysis shows that a suitable PV array configuration can improve the qZSI reliability.

Original language	English
Title of host publication	Proceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)
Number of pages	7
Place of Publication	Korea
Publisher	IEEE Press
Publication date	May 2019
Pages	3077-3083
Article number	8796895
ISBN (Print)	978-1-7281-1612-9
ISBN (Electronic)	978-89-5708-313-0
Publication status	Published - May 2019
Event	2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia) - Busan, Korea, Republic of Duration: 27 May 2019 → 30 May 2019

Conference

Conference	2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)
Country/Territory	Korea, Republic of
City	Busan
Period	27/05/2019 → 30/05/2019

Series	International Conference on Power Electronics
ISSN	2150-6078

Keywords

Boost converter
PV inverter
Quasi-Z-source inverter
Reliability
Shoot though
Wear-out

Access to Document

vbnAccepted author manuscript, 2.72 MB

https://ieeexplore.ieee.org/document/8796895

AUB Link

Search for the material in Aalborg University Library's search engine

Cite this

@inproceedings{8cee083dc2894206a359fb3d9ddf51c8,

title = "Reliability Assessment of Single-phase PV Inverters",

abstract = "This paper investigates the reliability of two types of single-phase Photo-Voltaic (PV)inverters, which are a quasi-Z-Source Inverter (qZSI)and a conventional two-stage boost-based inverter. The converters reliability is estimated by employing a mission-profile based reliability assessment approach modeling the wear-out failure of fragile components, i.e., capacitors and semiconductor devices. The obtained results reveal that the conventional two-stage inverter has better reliability compared to the qZSI due to the higher voltage and current stresses on qZSI components. Furthermore, the impact of PV array configuration on the Shoot Through (ST)state of the qZSI and consequently on its reliability is illustrated. The analysis shows that a suitable PV array configuration can improve the qZSI reliability.",

keywords = "Boost converter, PV inverter, Quasi-Z-source inverter, Reliability, Shoot though, Wear-out",

author = "Saeed Peyghami and Pooya Davari and Frede Blaabjerg and Ahmed Abdelhakim",

year = "2019",

month = may,

language = "English",

isbn = "978-1-7281-1612-9",

series = "International Conference on Power Electronics",

publisher = "IEEE Press",

pages = "3077--3083",

booktitle = "Proceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)",

note = "2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia) ; Conference date: 27-05-2019 Through 30-05-2019",

}

Peyghami, S , Davari, P , Blaabjerg, F & Abdelhakim, A 2019, Reliability Assessment of Single-phase PV Inverters. in Proceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)., 8796895, IEEE Press, Korea, International Conference on Power Electronics, pp. 3077-3083, 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia), Busan, Korea, Republic of, 27/05/2019. <https://ieeexplore.ieee.org/document/8796895>

Reliability Assessment of Single-phase PV Inverters. / Peyghami, Saeed ; Davari, Pooya ; Blaabjerg, Frede et al.
Proceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia). Korea: IEEE Press, 2019. p. 3077-3083 8796895 (International Conference on Power Electronics).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Reliability Assessment of Single-phase PV Inverters

AU - Peyghami, Saeed

AU - Davari, Pooya

AU - Blaabjerg, Frede

AU - Abdelhakim, Ahmed

PY - 2019/5

Y1 - 2019/5

N2 - This paper investigates the reliability of two types of single-phase Photo-Voltaic (PV)inverters, which are a quasi-Z-Source Inverter (qZSI)and a conventional two-stage boost-based inverter. The converters reliability is estimated by employing a mission-profile based reliability assessment approach modeling the wear-out failure of fragile components, i.e., capacitors and semiconductor devices. The obtained results reveal that the conventional two-stage inverter has better reliability compared to the qZSI due to the higher voltage and current stresses on qZSI components. Furthermore, the impact of PV array configuration on the Shoot Through (ST)state of the qZSI and consequently on its reliability is illustrated. The analysis shows that a suitable PV array configuration can improve the qZSI reliability.

AB - This paper investigates the reliability of two types of single-phase Photo-Voltaic (PV)inverters, which are a quasi-Z-Source Inverter (qZSI)and a conventional two-stage boost-based inverter. The converters reliability is estimated by employing a mission-profile based reliability assessment approach modeling the wear-out failure of fragile components, i.e., capacitors and semiconductor devices. The obtained results reveal that the conventional two-stage inverter has better reliability compared to the qZSI due to the higher voltage and current stresses on qZSI components. Furthermore, the impact of PV array configuration on the Shoot Through (ST)state of the qZSI and consequently on its reliability is illustrated. The analysis shows that a suitable PV array configuration can improve the qZSI reliability.

KW - Boost converter

KW - PV inverter

KW - Quasi-Z-source inverter

KW - Reliability

KW - Shoot though

KW - Wear-out

UR - http://www.scopus.com/inward/record.url?scp=85071607028&partnerID=8YFLogxK

M3 - Article in proceeding

SN - 978-1-7281-1612-9

T3 - International Conference on Power Electronics

SP - 3077

EP - 3083

BT - Proceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)

PB - IEEE Press

CY - Korea

T2 - 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)

Y2 - 27 May 2019 through 30 May 2019

ER -

Reliability Assessment of Single-phase PV Inverters

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

REPEPS: REliable Power Electronic based Power System

Cite this

Reliability Assessment of Single-phase PV Inverters

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

Projects

REPEPS: REliable Power Electronic based Power System

Cite this