Abstract
Various power decoupling methods have been proposed recently to replace the DC-link Electrolytic Capacitors (E-caps) in single-phase conversion system, in order to extend the lifetime and improve the reliability of the DC-link. However, it is still an open question whether the converter level reliability becomes better or not, since additional components are introduced and the loading of the existing components may be changed. This paper aims to study the converter level reliability of a single-phase full-bridge inverter with two kinds of active power decoupling module and to compare it with the traditional passive DC-link solution. The converter level reliability is obtained by component level electro-thermal stress modeling, lifetime model, Weibull distribution, and Reliability Block Diagram (RBD) method. The results are demonstrated by a 2 kW single-phase inverter application.
| Original language | English |
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| Title of host publication | Proceedings of IEEE Industrial Electronics Society, IECON 2016 |
| Number of pages | 6 |
| Publisher | IEEE Press |
| Publication date | Oct 2016 |
| Pages | 6841-6846 |
| ISBN (Electronic) | 978-1-5090-3474-1 |
| DOIs | |
| Publication status | Published - Oct 2016 |
| Event | 42nd Conference of the Industrial Electronics Society, IECON 2016: 42nd Annual Conference of the IEEE Industrial Electronics Society - Palazzo dei Congressi, Florence, Italy Duration: 24 Oct 2016 → 27 Oct 2016 http://www.iecon2016.org/?jjj=1471434927195 http://www.iecon2016.org/ |
Conference
| Conference | 42nd Conference of the Industrial Electronics Society, IECON 2016 |
|---|---|
| Location | Palazzo dei Congressi |
| Country/Territory | Italy |
| City | Florence |
| Period | 24/10/2016 → 27/10/2016 |
| Sponsor | IEEE Industrial Electronics Society (IES), Institute of Electrical and Electronics Engineers (IEEE) |
| Internet address |