Reliability evaluation of an impedance-source PV microconverter

Yanfeng Shen, Elizaveta Liivik, Frede Blaabjerg, Dmitri Vinnikov, Huai Wang, Andrii Chub

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

9 Citations (Scopus)

Abstract

The reliability of an impedance-source PV microconverter is evaluated based on the real-field mission profile. As part of a PV microinverter, the dc-dc microconverter is firstly described. Then the electro-thermal and lifetime models are built for the most reliability-critical components, i.e., the power semiconductor devices and capacitors. The finite element method (FEM) simulation is used for the thermal impedance extraction. The mission profile, i.e., the ambient temperature and solar irradiance, from Aalborg, Denmark is applied to the built electrothermal model. Finally, the thermal loading profiles and annual wear-out damage accumulation are obtained. In addition, experimental measurements from a 300-W converter prototype are given.
Original languageEnglish
Title of host publication2018 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages5
PublisherIEEE Press
Publication dateMar 2018
Pages1104-1108
ISBN (Print)978-1-5386-1179-1, 978-1-5386-1181-4
ISBN (Electronic)978-1-5386-1180-7
DOIs
Publication statusPublished - Mar 2018
Event2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, United States
Duration: 4 Mar 20188 Mar 2018

Conference

Conference2018 IEEE Applied Power Electronics Conference and Exposition (APEC)
Country/TerritoryUnited States
CitySan Antonio
Period04/03/201808/03/2018
SeriesIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN2470-6647

Keywords

  • Microconverter
  • PV
  • Reliability

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