Original language | English |
---|---|
Journal | Microelectronics Reliability |
Volume | 58 |
Pages (from-to) | 1-2 |
Number of pages | 2 |
ISSN | 0026-2714 |
DOIs | |
Publication status | Published - 2016 |
Reliability issues in power electronics
Francesco Iannuzzo*, Mauro Ciappa
*Corresponding author for this work
Research output: Contribution to journal › Editorial › peer-review
4
Citations
(Scopus)