Abstract
This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented
based on the state-of-the-arts.
based on the state-of-the-arts.
| Original language | English |
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| Title of host publication | Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020) |
| Number of pages | 6 |
| Publisher | VDE Verlag GMBH |
| Publication date | 2020 |
| Pages | 479-484 |
| ISBN (Print) | 978-3-8007-5225-6 |
| Publication status | Published - 2020 |
| Event | CIPS 2020; 11th International Conference on Integrated Power Electronics Systems - Duration: 24 Mar 2020 → 26 Mar 2020 |
Conference
| Conference | CIPS 2020; 11th International Conference on Integrated Power Electronics Systems |
|---|---|
| Period | 24/03/2020 → 26/03/2020 |