Review of Health Prognostics and Condition Monitoring of Electronic Components

Cherry Bhargava, Pardeep Kumar Sharma, Mohan Senthilkumar, Padmanaban Sanjeevikumar, Vigna K. Ramachandaramurthya, Zbigniew Leonowicz, Frede Blaabjerg, Massimo Mitolo

Research output: Contribution to journalJournal articleResearchpeer-review

46 Citations (Scopus)
82 Downloads (Pure)

Abstract

To meet the specifications of low cost, highly reliable electronic devices, fault diagnosis techniques play an essential role. It is vital to find flaws at an early stage in design, components, material, or manufacturing during the initial phase. This review paper attempts to summarize past development and recent advances in the areas about green manufacturing, maintenance, remaining useful life (RUL) prediction, and like. The current state of the art in reliability research for electronic components, mainly includes failure mechanisms, condition monitoring, and residual lifetime evaluation is explored. A critical analysis of reliability studies to identify their relative merits and usefulness of the outcome of these studies' vis-a-vis green manufacturing is presented. The wide array of statistical, empirical, and intelligent tools and techniques used in the literature are then identified and mapped. Finally, the findings are summarized, and the central research gap is highlighted.
Original languageEnglish
Article number9075164
JournalIEEE Access
Volume8
Pages (from-to)75163 - 75183
Number of pages21
ISSN2169-3536
DOIs
Publication statusPublished - Apr 2020

Keywords

  • Reliability methods
  • condition monitoring
  • faults and failiures
  • prognostics
  • diagnostics

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