Scanning gate spectroscopy on nanoclusters

L. Gurevich; L. Canali; L. P. Kouwenhoven

doi:10.1063/1.125761

Scanning gate spectroscopy on nanoclusters

L. Gurevich^*, L. Canali, L. P. Kouwenhoven

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

27 Citations (Scopus)

Abstract

A gated probe for scanning tunneling microscopy (STM) has been developed. The probe extends normal STM operations by means of an additional electrode fabricated next to the tunneling tip. The extra electrode does not make contact with the sample and can be used as a gate. We report on the recipe used for fabricating the tunneling tip and the gate electrode on a silicon nitride cantilever. We demonstrate the functioning of the scanning gate probes by performing single-electron tunneling spectroscopy on 20-nm-gold clusters for different gate voltages.

Original language	English
Journal	Applied Physics Letters
Volume	76
Issue number	3
Pages (from-to)	384-386
Number of pages	3
ISSN	0003-6951
DOIs	https://doi.org/10.1063/1.125761
Publication status	Published - 17 Jan 2000

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AB - A gated probe for scanning tunneling microscopy (STM) has been developed. The probe extends normal STM operations by means of an additional electrode fabricated next to the tunneling tip. The extra electrode does not make contact with the sample and can be used as a gate. We report on the recipe used for fabricating the tunneling tip and the gate electrode on a silicon nitride cantilever. We demonstrate the functioning of the scanning gate probes by performing single-electron tunneling spectroscopy on 20-nm-gold clusters for different gate voltages.

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Scanning gate spectroscopy on nanoclusters

Abstract

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