Scrum integration in stage-gate models for collaborative product development: A case study of three industrial manufacturers

Anita Friis Sommer, Andreas Slavensky, Vivi Thuy Nguyen, Kenn Steger-Jensen, Iskra Dukovska-Popovska

Research output: Contribution to book/anthology/report/conference proceedingConference abstract in proceedingResearchpeer-review

Abstract

The relevance of collaborative Product Development (PD) is rising with the decrease of product life cycles combined with growing customer demands. Industrial manufacturers now experience competition in the global market, where differentiation is necessary for survival. Hence, in order to differentiate from low-cost competitors and increase PD performance, some industrial manufacturers now seek competitive advantage by experimenting with new ways for collaborative PD. This includes integrating customer-focused agile process models, like Scrum, from the software industry into their existing PD models. Thus, instead of replacing traditional stage-gate models agile methods are currently integrated in existing PD models generating hybrid solution for collaborative PD. This paper includes a study of three industrial cases that have successfully integrated Scrum into a stage-gate process model for collaborative PD. The paper introduces the three functional hybrid models, including impact on PD performance, PD roles and customer collaboration.
Original languageEnglish
Title of host publicationProceedings of 2013 IEEE International Conference on Industrial Engineering and Engineering Management
PublisherIEEE Press
Publication date2013
Edition(USB)
ISBN (Print)978-1-4799-0985-8
Publication statusPublished - 2013
Event2013 IEEE International Conference on Industrial Engineering and Engineering Management - Swiss Hotel le Concorde, Bangkok, Thailand
Duration: 10 Dec 201313 Dec 2013

Conference

Conference2013 IEEE International Conference on Industrial Engineering and Engineering Management
LocationSwiss Hotel le Concorde
Country/TerritoryThailand
CityBangkok
Period10/12/201313/12/2013
SeriesIEEE Proceedings

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