Abstract
The invention relates to a measuring circuit facilitating monitoring of a voltage of a semiconductor switch, the measuring circuit comprises a plurality of measuring cells, wherein each of the measuring cells comprises at least one normally-on field-effect transistor, wherein each of the normally- on field-effect transistors are controlled by a gate signal from a resistor connected in series with the source connection of the normally-on field-effect transistor, and wherein a plurality of measuring cells are connected in series with the first end of the series connected measuring cells electrically connected to a terminal of the semiconductor switch and with the second end of the series connected measuring cells electrically connected to an analoge processing circuitry.
| Original language | English |
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| IPC | H03K17/00 |
| Patent number | DK201770767 |
| Country/Territory | Denmark |
| Priority date | 10/10/2016 |
| Priority number | DK2016PA70795 |
| Publication status | Published - 23 Apr 2018 |