Sensitivity analysis for influence diagrams

Research output: Contribution to journalJournal articleResearchpeer-review

20 Citations (Scopus)
Original languageEnglish
JournalIEEE Transactions of Cybernetics, Man and Machines
Volume33
Issue number2
Pages (from-to)223-234
Publication statusPublished - 2003

Cite this

@article{72c0ae60001e11dab4d5000ea68e967b,
title = "Sensitivity analysis for influence diagrams",
author = "Nielsen, {Thomas Dyhre} and Jensen, {Finn Verner}",
year = "2003",
language = "English",
volume = "33",
pages = "223--234",
journal = "IEEE Transactions of Cybernetics, Man and Machines",
number = "2",

}

Sensitivity analysis for influence diagrams. / Nielsen, Thomas Dyhre; Jensen, Finn Verner.

In: IEEE Transactions of Cybernetics, Man and Machines, Vol. 33, No. 2, 2003, p. 223-234.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Sensitivity analysis for influence diagrams

AU - Nielsen, Thomas Dyhre

AU - Jensen, Finn Verner

PY - 2003

Y1 - 2003

M3 - Journal article

VL - 33

SP - 223

EP - 234

JO - IEEE Transactions of Cybernetics, Man and Machines

JF - IEEE Transactions of Cybernetics, Man and Machines

IS - 2

ER -