Sharpness, sharpness related attributes, and their physical correlates

M. Nijenhuis, R. Hamberg, C. Teunissen, S. Bech, H. Looren De Jong, P. Houben, S. K. Pramanik

Research output: Contribution to journalConference article in JournalResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3025
Pages (from-to)173-184
Number of pages12
ISSN0277-786X
DOIs
Publication statusPublished - 4 Apr 1997
Externally publishedYes
EventVery High Resolution and Quality Imaging II 1997 - San Jose, United States
Duration: 8 Feb 199714 Feb 1997

Conference

ConferenceVery High Resolution and Quality Imaging II 1997
Country/TerritoryUnited States
CitySan Jose
Period08/02/199714/02/1997

Keywords

  • Image quality
  • Measurements with CCD cameras
  • Perceptual models
  • Sharpness

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