Short Circuit Protection of Silicon Carbide MOSFETs: Challenges, Methods, and Prospects

Man Zhang, Helong Li, Zhiqing Yang, Shuang Zhao, Xiongfei Wang, Lijian Ding

Research output: Contribution to journalJournal articleResearchpeer-review

5 Citations (Scopus)
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Abstract

With the fabulous growth of the renewable energy industry, silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (mosfets) are increasingly finding applications in various scenarios. To ensure the safe operation of SiC mosfets, there is a pressing need for fast and reliable short-circuit protection methods. This article aims to give a detail overview of the existing short-circuit protection technologies for SiC mosfets regarding their merits and limitations. First, the challenges associated with short-circuit protection are comprehensively analyzed. Subsequently, thorough comparisons of state-of-the-art short-circuit detection methods and soft turn-off strategies are conducted, respectively. Finally, this work outlines the prospects of short-circuit protection technologies in the aspects of deficiencies and optimization of short-circuit protection in multichip power module with paralleled SiC mosfets.

Original languageEnglish
JournalIEEE Transactions on Power Electronics
Volume39
Issue number10
Pages (from-to)13081-13095
Number of pages15
ISSN0885-8993
DOIs
Publication statusPublished - 2024

Keywords

  • SiC MOSFETs
  • robustness
  • short-circuit protection
  • soft turn-off strategies
  • Robustness
  • silicon carbide (SiC) mosfets

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