Abstract
Noble gas ions have been implanted into fullerene in the solid state up to fluences which far exceed the molecular destruction threshold. The corresponding depth profile peaks in Rutherford backscattering experiments move strongly towards the surface signal with increasing fluence. This suggests a high degree of target erosion due to collisional sputtering. One consequence of this process can be an interesting and basic effect on the nature of the fullerene destruction products.
Original language | English |
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Journal | Nuclear Inst. and Methods in Physics Research, B |
Volume | 103 |
Issue number | 4 |
Pages (from-to) | 415-422 |
Number of pages | 8 |
ISSN | 0168-583X |
DOIs | |
Publication status | Published - 1 Dec 1995 |