State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems

Marius Bozga; Alexandre David; Arnd Hartmanns; Kim Guldstrand Larsen; Axel Legay; Jan Tretmans

doi:10.1109/DATE.2012.6176499

State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems

Marius Bozga, Alexandre David, Arnd Hartmanns, Kim Guldstrand Larsen, Axel Legay, Jan Tretmans

Research output: Contribution to journal › Conference article in Journal › Research › peer-review

11 Citations (Scopus)

Abstract

This paper surveys well-established/recent tools and
techniques developed for the design of rigorous embedded sys-
tems. We will first survey U PPAAL and M ODEST, two tools
capable of dealing with both timed and stochastic aspects. Then,
we will overview the BIP framework for modular design and
code generation. Finally, model-based testing will be discussed.

Original language	English
Journal	A C M / I E E E Design Automation Conference. Proceedings
Pages (from-to)	370-375
ISSN	0738-100X
DOIs	https://doi.org/10.1109/DATE.2012.6176499
Publication status	Published - 2012
Event	15th Conference on Design, Automation, and Test in Europe (DATE'12) - Dresden, Germany Duration: 12 Mar 2012 → 16 Mar 2012

Conference

Conference	15th Conference on Design, Automation, and Test in Europe (DATE'12)
Country/Territory	Germany
City	Dresden
Period	12/03/2012 → 16/03/2012

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http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176499

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@inproceedings{81f70befde894211b9b4013f20d52c86,

title = "State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems",

abstract = "This paper surveys well-established/recent tools andtechniques developed for the design of rigorous embedded sys-tems. We will first survey U PPAAL and M ODEST, two toolscapable of dealing with both timed and stochastic aspects. Then,we will overview the BIP framework for modular design andcode generation. Finally, model-based testing will be discussed.",

author = "Marius Bozga and Alexandre David and Arnd Hartmanns and Larsen, {Kim Guldstrand} and Axel Legay and Jan Tretmans",

year = "2012",

doi = "10.1109/DATE.2012.6176499",

language = "English",

pages = "370--375",

journal = "A C M / I E E E Design Automation Conference. Proceedings",

issn = "0738-100X",

publisher = "IEEE Computer Society Press",

note = "15th Conference on Design, Automation, and Test in Europe (DATE'12) ; Conference date: 12-03-2012 Through 16-03-2012",

}

TY - GEN

T1 - State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems

AU - Bozga, Marius

AU - David, Alexandre

AU - Hartmanns, Arnd

AU - Larsen, Kim Guldstrand

AU - Legay, Axel

AU - Tretmans, Jan

PY - 2012

Y1 - 2012

N2 - This paper surveys well-established/recent tools andtechniques developed for the design of rigorous embedded sys-tems. We will first survey U PPAAL and M ODEST, two toolscapable of dealing with both timed and stochastic aspects. Then,we will overview the BIP framework for modular design andcode generation. Finally, model-based testing will be discussed.

AB - This paper surveys well-established/recent tools andtechniques developed for the design of rigorous embedded sys-tems. We will first survey U PPAAL and M ODEST, two toolscapable of dealing with both timed and stochastic aspects. Then,we will overview the BIP framework for modular design andcode generation. Finally, model-based testing will be discussed.

U2 - 10.1109/DATE.2012.6176499

DO - 10.1109/DATE.2012.6176499

M3 - Conference article in Journal

SN - 0738-100X

SP - 370

EP - 375

JO - A C M / I E E E Design Automation Conference. Proceedings

JF - A C M / I E E E Design Automation Conference. Proceedings

T2 - 15th Conference on Design, Automation, and Test in Europe (DATE'12)

Y2 - 12 March 2012 through 16 March 2012

ER -

State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems

Abstract

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Cite this