Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard, Stefan Hein Bengtson, Malte Pedersen, Christian Rankl, Thomas B. Moeslund

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.
Original languageEnglish
Title of host publicationProceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP
PublisherSCITEPRESS Digital Library
Publication date2016
Pages110-117
ISBN (Print)978-989-758-175-5
DOIs
Publication statusPublished - 2016
Event11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Rome, Italy
Duration: 26 Mar 201529 Feb 2016
http://www.grapp.visigrapp.org/

Conference

Conference11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications
CountryItaly
CityRome
Period26/03/201529/02/2016
Internet address

Fingerprint

Microscopes
Surveying
Textures
Polynomials

Cite this

Vestergaard, M. Z., Bengtson, S. H., Pedersen, M., Rankl, C., & Moeslund, T. B. (2016). Stitching Grid-wise Atomic Force Microscope Images. In Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP (pp. 110-117). SCITEPRESS Digital Library. https://doi.org/10.5220/0005716501100117
Vestergaard, Mathias Zacho ; Bengtson, Stefan Hein ; Pedersen, Malte ; Rankl, Christian ; Moeslund, Thomas B. / Stitching Grid-wise Atomic Force Microscope Images. Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. pp. 110-117
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Vestergaard, MZ, Bengtson, SH, Pedersen, M, Rankl, C & Moeslund, TB 2016, Stitching Grid-wise Atomic Force Microscope Images. in Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, pp. 110-117, 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, Rome, Italy, 26/03/2015. https://doi.org/10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images. / Vestergaard, Mathias Zacho; Bengtson, Stefan Hein; Pedersen, Malte; Rankl, Christian; Moeslund, Thomas B.

Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. p. 110-117.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Vestergaard MZ, Bengtson SH, Pedersen M, Rankl C, Moeslund TB. Stitching Grid-wise Atomic Force Microscope Images. In Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library. 2016. p. 110-117 https://doi.org/10.5220/0005716501100117