Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard; Stefan Hein Bengtson; Malte Pedersen; Christian Rankl; Thomas B. Moeslund

doi:10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard, Stefan Hein Bengtson, Malte Pedersen, Christian Rankl, Thomas B. Moeslund

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

Abstract

Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

Original language	English
Title of host publication	Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP
Publisher	SCITEPRESS Digital Library
Publication date	2016
Pages	110-117
ISBN (Print)	978-989-758-175-5
DOIs	https://doi.org/10.5220/0005716501100117
Publication status	Published - 2016
Event	11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Rome, Italy Duration: 26 Mar 2015 → 29 Feb 2016 http://www.grapp.visigrapp.org/

Conference

Conference	11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications
Country/Territory	Italy
City	Rome
Period	26/03/2015 → 29/02/2016
Internet address	http://www.grapp.visigrapp.org/

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@inproceedings{24e7d47669ca42c7b77c7c1dea63db03,

title = "Stitching Grid-wise Atomic Force Microscope Images",

abstract = "Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.",

author = "Vestergaard, {Mathias Zacho} and Bengtson, {Stefan Hein} and Malte Pedersen and Christian Rankl and Moeslund, {Thomas B.}",

year = "2016",

doi = "10.5220/0005716501100117",

language = "English",

isbn = "978-989-758-175-5",

pages = "110--117",

booktitle = "Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP",

publisher = "SCITEPRESS Digital Library",

note = "11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2016 ; Conference date: 26-03-2015 Through 29-02-2016",

url = "http://www.grapp.visigrapp.org/",

}

Vestergaard, MZ, Bengtson, SH , Pedersen, M, Rankl, C & Moeslund, TB 2016, Stitching Grid-wise Atomic Force Microscope Images. in Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, pp. 110-117, 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, Rome, Italy, 26/03/2015. https://doi.org/10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images. / Vestergaard, Mathias Zacho; Bengtson, Stefan Hein ; Pedersen, Malte et al.
Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. p. 110-117.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Stitching Grid-wise Atomic Force Microscope Images

AU - Vestergaard, Mathias Zacho

AU - Bengtson, Stefan Hein

AU - Pedersen, Malte

AU - Rankl, Christian

AU - Moeslund, Thomas B.

PY - 2016

Y1 - 2016

N2 - Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

AB - Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

U2 - 10.5220/0005716501100117

DO - 10.5220/0005716501100117

M3 - Article in proceeding

SN - 978-989-758-175-5

SP - 110

EP - 117

BT - Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP

PB - SCITEPRESS Digital Library

T2 - 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications

Y2 - 26 March 2015 through 29 February 2016

ER -

Stitching Grid-wise Atomic Force Microscope Images

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