Test bench for thermal cycling of 10 kV silicon carbide power modules

Simon Dyhr Sønderskov, Asger Bjørn Jørgensen, Anders Eggert Maarbjerg, Kristian Linding Frederiksen, Stig Munk-Nielsen, Szymon Beczkowski, Christian Uhrenfeldt

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2 Citations (Scopus)
110 Downloads (Pure)

Abstract

This paper presents a test bench for lifetime investigation of 10 kV silicon carbide power modules. The test bench subjects high voltage switching operation to the modules while power cycling. Thus both a thermal and electrical operating point is emulated. The power cycling setup features offline measurement of on-state voltages and direct real-time measurement of die surface temperatures, enabled by fiber optical sensors, which are built into the power modules. A thermal model of the module prototypes, based on the temperature measurements, is established. Independent verification steps have been made to validate the performance of the on-state voltage measurement and the thermal model. Issues are revealed in the form of common mode currents in gate drive supply, which should be remedied. Finally a new operating point for power cycling is suggested to better stress the power modules.
Original languageEnglish
Title of host publicationProceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)
Number of pages8
Place of PublicationKarlsruhe, Germany
PublisherIEEE
Publication dateSep 2016
ISBN (Electronic)978-9-0758-1524-5
DOIs
Publication statusPublished - Sep 2016
EventEPE'16 - ECCE: 18th European Conference on Power Electronics and Applications - Karlsruhe Town Hall (Stadthalle), Karlsruhe, Germany
Duration: 5 Sep 20169 Sep 2016
Conference number: 18
http://www.epe2016.com/

Conference

ConferenceEPE'16 - ECCE: 18th European Conference on Power Electronics and Applications
Number18
LocationKarlsruhe Town Hall (Stadthalle)
CountryGermany
CityKarlsruhe
Period05/09/201609/09/2016
Internet address

Keywords

  • Reliability
  • Silicon Carbide (SiC)
  • Power cycling

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  • Cite this

    Sønderskov, S. D., Jørgensen, A. B., Maarbjerg, A. E., Frederiksen, K. L., Munk-Nielsen, S., Beczkowski, S., & Uhrenfeldt, C. (2016). Test bench for thermal cycling of 10 kV silicon carbide power modules. In Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) IEEE. https://doi.org/10.1109/EPE.2016.7695328