Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation

Angel Ruiz de Vega; Pramod Ghimire; Kristian Bonderup Pedersen; Ionut Trintis; Szymon Beczkowski; Stig Munk-Nielsen; Bjørn Rannestad; Paul Bach Thøgersen

doi:10.1109/IPEC.2014.6869948

Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation

Angel Ruiz de Vega, Pramod Ghimire, Kristian Bonderup Pedersen, Ionut Trintis, Szymon Beczkowski, Stig Munk-Nielsen, Bjørn Rannestad, Paul Bach Thøgersen

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

24 Citations (Scopus)

Abstract

Several accelerated test methods exist in order to study the failures mechanisms of the high power IGBT modules like temperature cycling test or power cycles based on DC current pulses. The main drawback is that the test conditions do not represent the real performance and stress conditions of the device in real application. The hypothesis is that ageing of power modules closer to real environment including cooling system, full dc-link voltage and continuous PWM operation could lead to more accurate study of failure mechanism. A new type of test setup is proposed, which can create different real load conditions like in the field. Furthermore, collector-emitter voltage (Vce) has been used as indicator of the wear-out of the high power IGBT module. The innovative monitoring system implemented in the test setup is capable of measure the Vce and forward voltage of the antiparallel diode (Vf) during converter operation, which is also demonstrated.

Original language	English
Title of host publication	Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)
Number of pages	6
Place of Publication	Hiroshima, Japan
Publisher	IEEE Press
Publication date	18 May 2014
Pages	2547-2553
DOIs	https://doi.org/10.1109/IPEC.2014.6869948
Publication status	Published - 18 May 2014
Event	2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA) - Hiroshima, Japan Duration: 18 May 2014 → 21 May 2014

Conference

Conference	2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)
Country/Territory	Japan
City	Hiroshima
Period	18/05/2014 → 21/05/2014

Keywords

Accelerated lifetime testing
Online monitoring
On-state voltage monitoring

Access to Document

10.1109/IPEC.2014.6869948

http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6869948&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F6857936%2F6869559%2F06869948.pdf%3Farnumber%3D6869948

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IEPE: Intelligent and Efficient Power Electronics (IEPE)
Munk-Nielsen, S.
The Danish National Advanced Technology Foundation
01/04/2012 → 31/03/2017
Project: Research
Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research

Cite this

de Vega, A. R., Ghimire, P., Pedersen, K. B., Trintis, I., Beczkowski, S., Munk-Nielsen, S., Rannestad, B., & Thøgersen, P. B. (2014). Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation. In Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA) (pp. 2547-2553 ). IEEE Press. https://doi.org/10.1109/IPEC.2014.6869948

@inproceedings{d02dde99c0f6479d8c52e8540f37195f,

title = "Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation",

abstract = "Several accelerated test methods exist in order to study the failures mechanisms of the high power IGBT modules like temperature cycling test or power cycles based on DC current pulses. The main drawback is that the test conditions do not represent the real performance and stress conditions of the device in real application. The hypothesis is that ageing of power modules closer to real environment including cooling system, full dc-link voltage and continuous PWM operation could lead to more accurate study of failure mechanism. A new type of test setup is proposed, which can create different real load conditions like in the field. Furthermore, collector-emitter voltage (Vce) has been used as indicator of the wear-out of the high power IGBT module. The innovative monitoring system implemented in the test setup is capable of measure the Vce and forward voltage of the antiparallel diode (Vf) during converter operation, which is also demonstrated.",

keywords = "Accelerated lifetime testing, Online monitoring , On-state voltage monitoring",

author = "{de Vega}, {Angel Ruiz} and Pramod Ghimire and Pedersen, {Kristian Bonderup} and Ionut Trintis and Szymon Beczkowski and Stig Munk-Nielsen and Bj{\o}rn Rannestad and Th{\o}gersen, {Paul Bach}",

year = "2014",

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doi = "10.1109/IPEC.2014.6869948",

language = "English",

pages = "2547--2553 ",

booktitle = "Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)",

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de Vega, AR, Ghimire, P, Pedersen, KB, Trintis, I, Beczkowski, S , Munk-Nielsen, S, Rannestad, B & Thøgersen, PB 2014, Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation. in Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA). IEEE Press, Hiroshima, Japan , pp. 2547-2553 , 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), Hiroshima, Japan, 18/05/2014. https://doi.org/10.1109/IPEC.2014.6869948

Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation. / de Vega, Angel Ruiz; Ghimire, Pramod; Pedersen, Kristian Bonderup et al.
Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA). Hiroshima, Japan : IEEE Press, 2014. p. 2547-2553 .

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation

AU - de Vega, Angel Ruiz

AU - Ghimire, Pramod

AU - Pedersen, Kristian Bonderup

AU - Trintis, Ionut

AU - Beczkowski, Szymon

AU - Munk-Nielsen, Stig

AU - Rannestad, Bjørn

AU - Thøgersen, Paul Bach

PY - 2014/5/18

Y1 - 2014/5/18

N2 - Several accelerated test methods exist in order to study the failures mechanisms of the high power IGBT modules like temperature cycling test or power cycles based on DC current pulses. The main drawback is that the test conditions do not represent the real performance and stress conditions of the device in real application. The hypothesis is that ageing of power modules closer to real environment including cooling system, full dc-link voltage and continuous PWM operation could lead to more accurate study of failure mechanism. A new type of test setup is proposed, which can create different real load conditions like in the field. Furthermore, collector-emitter voltage (Vce) has been used as indicator of the wear-out of the high power IGBT module. The innovative monitoring system implemented in the test setup is capable of measure the Vce and forward voltage of the antiparallel diode (Vf) during converter operation, which is also demonstrated.

AB - Several accelerated test methods exist in order to study the failures mechanisms of the high power IGBT modules like temperature cycling test or power cycles based on DC current pulses. The main drawback is that the test conditions do not represent the real performance and stress conditions of the device in real application. The hypothesis is that ageing of power modules closer to real environment including cooling system, full dc-link voltage and continuous PWM operation could lead to more accurate study of failure mechanism. A new type of test setup is proposed, which can create different real load conditions like in the field. Furthermore, collector-emitter voltage (Vce) has been used as indicator of the wear-out of the high power IGBT module. The innovative monitoring system implemented in the test setup is capable of measure the Vce and forward voltage of the antiparallel diode (Vf) during converter operation, which is also demonstrated.

KW - Accelerated lifetime testing

KW - Online monitoring

KW - On-state voltage monitoring

U2 - 10.1109/IPEC.2014.6869948

DO - 10.1109/IPEC.2014.6869948

M3 - Article in proceeding

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EP - 2553

BT - Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)

PB - IEEE Press

CY - Hiroshima, Japan

T2 - 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)

Y2 - 18 May 2014 through 21 May 2014

ER -

de Vega AR, Ghimire P, Pedersen KB, Trintis I, Beczkowski S , Munk-Nielsen S et al. Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation. In Proceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA). Hiroshima, Japan : IEEE Press. 2014. p. 2547-2553 doi: 10.1109/IPEC.2014.6869948

Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation

Abstract

Conference

Keywords

Access to Document

AUB Link

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Projects

IEPE: Intelligent and Efficient Power Electronics (IEPE)

Center Of Reliable Power Electronics (CORPE)

Cite this