Test Structures and Techniques for On-Wafer CMOS TRL Calibration

Michael Bohl Jenner, T. E. Kolding

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearch

Original languageEnglish
Title of host publicationProceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001
Publication date2001
Pages137-140
Publication statusPublished - 2001
EventTest Structures and Techniques for On-Wafer CMOS TRL Calibration -
Duration: 19 May 2010 → …

Conference

ConferenceTest Structures and Techniques for On-Wafer CMOS TRL Calibration
Period19/05/2010 → …

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