Test Structures and Techniques for On-Wafer CMOS TRL Calibration

Michael Bohl Jenner, T. E. Kolding

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

Original language	English
Title of host publication	Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001
Publication date	2001
Pages	137-140
Publication status	Published - 2001
Event	Test Structures and Techniques for On-Wafer CMOS TRL Calibration - Duration: 19 May 2010 → …

Conference	Test Structures and Techniques for On-Wafer CMOS TRL Calibration
Period	19/05/2010 → …

Cite this

@inproceedings{22a78280809411db8b97000ea68e967b,

title = "Test Structures and Techniques for On-Wafer CMOS TRL Calibration",

author = "Jenner, {Michael Bohl} and Kolding, {T. E.}",

year = "2001",

language = "English",

pages = "137--140",

booktitle = "Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001",

note = "Test Structures and Techniques for On-Wafer CMOS TRL Calibration ; Conference date: 19-05-2010",

}

TY - GEN

T1 - Test Structures and Techniques for On-Wafer CMOS TRL Calibration

AU - Jenner, Michael Bohl

AU - Kolding, T. E.

PY - 2001

Y1 - 2001

M3 - Article in proceeding

SP - 137

EP - 140

BT - Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001

T2 - Test Structures and Techniques for On-Wafer CMOS TRL Calibration

Y2 - 19 May 2010

ER -