Abstract
Abstract–Lifetime prediction involves various aspects of uncertainties due to limited mission profile data, lifetime models, electro-thermal modeling errors, etc. The predicted lifetime results may have considerable discrepancies with different assumptions of the uncertainties. This study aims to investigate the impact of different lifetime model assumptions for the IGBT switches in a motor drive application with a specific representative operation profile. Moreover, the sensitivity of the IGBT switching frequency and operating grid voltage to the predicted lifetime is also studied. The outcomes serve as a first effort to quantifying the uncertainties in the reliability analysis of power electronic systems for motor drive applications.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the IEEE International Power Electronics and Application Conference and Exposition (PEAC 2018) |
| Number of pages | 6 |
| Place of Publication | China |
| Publisher | IEEE Press |
| Publication date | Nov 2018 |
| Pages | 1-6 |
| ISBN (Print) | 978-1-5386-6055-3 |
| ISBN (Electronic) | 978-1-5386-6054-6 |
| DOIs | |
| Publication status | Published - Nov 2018 |
| Event | 2nd IEEE Power Electronics and Applications Conference and Exposition - Shenzhen, China Duration: 4 Nov 2018 → 7 Nov 2018 Conference number: 2nd http://www.peac-conf.org/ |
Conference
| Conference | 2nd IEEE Power Electronics and Applications Conference and Exposition |
|---|---|
| Number | 2nd |
| Country/Territory | China |
| City | Shenzhen |
| Period | 04/11/2018 → 07/11/2018 |
| Internet address |
Keywords
- power semiconductor devices
- lifetime model
- uncertainty analysis
- sensitivity analysis
- motor drive