Vce as early indicator of IGBT module failure mode

Kristian Bonderup Pedersen, Peter Kjær Kristensen, Kjeld Pedersen, Christian Uhrenfeldt, Stig Munk-Nielsen

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

20 Citations (Scopus)

Original language	English
Title of host publication	2017 IEEE International Reliability Physics Symposium (IRPS)
Number of pages	6
Publisher	IEEE (Institute of Electrical and Electronics Engineers)
Publication date	1 Jun 2017
Article number	FA-1
ISBN (Electronic)	978-1-5090-6641-4
DOIs	https://doi.org/10.1109/IRPS.2017.7936371
Publication status	Published - 1 Jun 2017
Event	The 2017 International Reliability Physics Symposium - Monterey, United States Duration: 2 Apr 2017 → 6 Apr 2017 http://irps.org/

Conference	The 2017 International Reliability Physics Symposium
Country/Territory	United States
City	Monterey
Period	02/04/2017 → 06/04/2017
Internet address	http://irps.org/

Access to Document

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title = "Vce as early indicator of IGBT module failure mode",

author = "Pedersen, {Kristian Bonderup} and Kristensen, {Peter Kj{\ae}r} and Kjeld Pedersen and Christian Uhrenfeldt and Stig Munk-Nielsen",

year = "2017",

month = jun,

day = "1",

doi = "10.1109/IRPS.2017.7936371",

language = "English",

booktitle = "2017 IEEE International Reliability Physics Symposium (IRPS)",

publisher = "IEEE (Institute of Electrical and Electronics Engineers)",

address = "United States",

note = "The 2017 International Reliability Physics Symposium, 2017 IRPS ; Conference date: 02-04-2017 Through 06-04-2017",

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Pedersen, KB, Kristensen, PK , Pedersen, K, Uhrenfeldt, C & Munk-Nielsen, S 2017, Vce as early indicator of IGBT module failure mode. in 2017 IEEE International Reliability Physics Symposium (IRPS)., FA-1, IEEE (Institute of Electrical and Electronics Engineers), The 2017 International Reliability Physics Symposium, Monterey, California, United States, 02/04/2017. https://doi.org/10.1109/IRPS.2017.7936371

Vce as early indicator of IGBT module failure mode. / Pedersen, Kristian Bonderup; Kristensen, Peter Kjær ; Pedersen, Kjeld et al.
2017 IEEE International Reliability Physics Symposium (IRPS). IEEE (Institute of Electrical and Electronics Engineers), 2017. FA-1.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Vce as early indicator of IGBT module failure mode

AU - Pedersen, Kristian Bonderup

AU - Kristensen, Peter Kjær

AU - Pedersen, Kjeld

AU - Uhrenfeldt, Christian

AU - Munk-Nielsen, Stig

PY - 2017/6/1

Y1 - 2017/6/1

U2 - 10.1109/IRPS.2017.7936371

DO - 10.1109/IRPS.2017.7936371

M3 - Article in proceeding

BT - 2017 IEEE International Reliability Physics Symposium (IRPS)

PB - IEEE (Institute of Electrical and Electronics Engineers)

T2 - The 2017 International Reliability Physics Symposium

Y2 - 2 April 2017 through 6 April 2017

ER -