Abstract
This paper presents a single-ended protection scheme based on an artificial neural network (ANN) and a variational mode decomposition (VMD) for the voltage source converter (VSC) multiterminal high voltage DC (MT-HVDC) system. The developed technique depends on the utilization of VMD for feature extraction of measured voltage and current signals which are transferred into the intrinsic mode function (IMF). Then the Teager energy operator (TEO) is applied for tracking the energy content of the IMFs. The energy content of the IMFs is fed into the multilayer perceptron neural network (MLP) neural network for the identification of faults in a test system. The effectiveness of the proposed method is verified on a four-terminal HVDC system with several case studies including high impedance faults (HIFs), and disturbances by using the PSCAD/EMTDC software. The developed ANN-based fault identification method provides promising results in terms of accurate and fast fault detection features. Simulation results verify the accuracy of the proposed protection method for VSC MT-HVDC systems.
Original language | English |
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Title of host publication | 2023 2nd International Conference on Power Systems and Electrical Technology, PSET 2023 |
Number of pages | 6 |
Publisher | IEEE (Institute of Electrical and Electronics Engineers) |
Publication date | 25 Aug 2023 |
Pages | 219-224 |
ISBN (Print) | 979-8-3503-3969-7 |
ISBN (Electronic) | 9798350339703 |
DOIs | |
Publication status | Published - 25 Aug 2023 |
Event | 2023 2nd International Conference on Power Systems and Electrical Technology (PSET). - Milan, Italy Duration: 25 Aug 2023 → 27 Aug 2023 http://www.pset.org/index.html |
Conference
Conference | 2023 2nd International Conference on Power Systems and Electrical Technology (PSET). |
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Country/Territory | Italy |
City | Milan |
Period | 25/08/2023 → 27/08/2023 |
Internet address |
Keywords
- VSC MT-HVDC
- Protection systems
- Variational mode decomposition (VMD)
- Teager energy operator (TEO)
- Artificial neural network (ANN)