Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen; Jan Østergaard; Torben Larsen

doi:10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen, Jan Østergaard, Torben Larsen

Institut for Elektroniske Systemer

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

1 Citationer (Scopus)

Originalsprog	Engelsk
Titel	2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)
Forlag	IEEE Signal Processing Society
Publikationsdato	14 dec. 2015
Sider	418 - 422
ISBN (Elektronisk)	978-1-4799-7591-4
DOI	https://doi.org/10.1109/GlobalSIP.2015.7418229
Status	Udgivet - 14 dec. 2015
Begivenhed	3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) - Orlando, FL, USA Varighed: 14 dec. 2015 → 16 dec. 2015

Konference

Konference	3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)
Land/Område	USA
By	Orlando, FL
Periode	14/12/2015 → 16/12/2015

Navn	IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

Adgang til dokumentet

10.1109/GlobalSIP.2015.7418229

AUB Link

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Pedersen15

FastAFM: Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing
Larsen, T., Østergaard, J., Jensen, T., Arildsen, T., Oxvig, C. S. & Pedersen, P. S.
01/09/2013 → 31/08/2016
Projekter: Projekt › Forskning

Citationsformater

Pedersen, Patrick Steffen ; Østergaard, Jan ; Larsen, Torben. / Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. s. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).

@inproceedings{a16ebda86a484f038b5268eeec4b2278,

title = "Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy",

author = "Pedersen, {Patrick Steffen} and Jan {\O}stergaard and Torben Larsen",

year = "2015",

month = dec,

day = "14",

doi = "10.1109/GlobalSIP.2015.7418229",

language = "English",

series = "IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings",

publisher = "IEEE Signal Processing Society",

pages = "418 -- 422",

booktitle = "2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)",

address = "United States",

note = "3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) ; Conference date: 14-12-2015 Through 16-12-2015",

}

Pedersen, PS, Østergaard, J & Larsen, T 2015, Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. i 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings, s. 418 - 422, 3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015), Orlando, FL, USA, 14/12/2015. https://doi.org/10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. / Pedersen, Patrick Steffen; Østergaard, Jan ; Larsen, Torben.
2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. s. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

AU - Pedersen, Patrick Steffen

AU - Østergaard, Jan

AU - Larsen, Torben

PY - 2015/12/14

Y1 - 2015/12/14

U2 - 10.1109/GlobalSIP.2015.7418229

DO - 10.1109/GlobalSIP.2015.7418229

M3 - Article in proceeding

T3 - IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

SP - 418

EP - 422

BT - 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)

PB - IEEE Signal Processing Society

T2 - 3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)

Y2 - 14 December 2015 through 16 December 2015

ER -

Pedersen PS, Østergaard J , Larsen T. Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. I 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society. 2015. s. 418 - 422. (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings). doi: 10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

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Projekter

FastAFM: Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing

Citationsformater