Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

Sergiu Spataru; Peter Hacke; Dezso Sera; Stephen Glick; Tamas Kerekes; Remus Teodorescu

doi:10.1109/PVSC.2015.7356124

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

Sergiu Spataru, Peter Hacke, Dezso Sera, Stephen Glick, Tamas Kerekes, Remus Teodorescu

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

31 Citations (Scopus)

Abstract

This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module’s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

Original language	English
Title of host publication	Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Number of pages	6
Publisher	IEEE Press
Publication date	Jun 2015
Pages	1-6
ISBN (Electronic)	978-1-4799-79 44-8
DOIs	https://doi.org/10.1109/PVSC.2015.7356124
Publication status	Published - Jun 2015
Event	42nd IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States Duration: 14 Jun 2015 → 19 Jun 2015 Conference number: 42

Conference

Conference	42nd IEEE Photovoltaic Specialists Conference
Number	42
Country/Territory	United States
City	New Orleans, LA
Period	14/06/2015 → 19/06/2015

Series	I E E E Photovoltaic Specialists Conference. Conference Record
Volume	42
ISSN	0160-8371

Keywords

Crystalline silicon
Cell cracks
Diagnosis
Electroluminescence
Photovoltaic modules

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10.1109/PVSC.2015.7356124

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SPVSYS: Smart Photovoltaic Systems
Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.
ForskEL
01/01/2011 → 31/07/2015
Project: Research

Cite this

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title = "Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging",

abstract = "This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module{\textquoteright}s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers. ",

keywords = "Crystalline silicon, Cell cracks, Diagnosis, Electroluminescence, Photovoltaic modules",

author = "Sergiu Spataru and Peter Hacke and Dezso Sera and Stephen Glick and Tamas Kerekes and Remus Teodorescu",

year = "2015",

month = jun,

doi = "10.1109/PVSC.2015.7356124",

language = "English",

series = "I E E E Photovoltaic Specialists Conference. Conference Record",

publisher = "IEEE Press",

pages = "1--6",

booktitle = "Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)",

note = "42nd IEEE Photovoltaic Specialists Conference, 42nd IEEE PVSC ; Conference date: 14-06-2015 Through 19-06-2015",

}

Spataru, S, Hacke, P, Sera, D, Glick, S, Kerekes, T & Teodorescu, R 2015, Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging. in Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, vol. 42, pp. 1-6, 42nd IEEE Photovoltaic Specialists Conference, New Orleans, LA, United States, 14/06/2015. https://doi.org/10.1109/PVSC.2015.7356124

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging. / Spataru, Sergiu; Hacke, Peter; Sera, Dezso et al.
Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, 2015. p. 1-6 (I E E E Photovoltaic Specialists Conference. Conference Record, Vol. 42).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

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AU - Spataru, Sergiu

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AU - Kerekes, Tamas

AU - Teodorescu, Remus

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AB - This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module’s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

KW - Crystalline silicon

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KW - Diagnosis

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KW - Photovoltaic modules

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M3 - Article in proceeding

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BT - Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

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T2 - 42nd IEEE Photovoltaic Specialists Conference

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ER -

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

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Conference

Keywords

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Projects

SPVSYS: Smart Photovoltaic Systems

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