Abstract
Fuel cells are becoming a promising energy source for various applications due to its relatively high efficiency and reliability, and low pollution. They have been applied in backup power systems in telecom applications, where reliability and availability are high priority performance factors. This paper describes a lifetime prediction method for the power semiconductors used in the power conditioning of a fuel cell based backup system, considering both the long-term standby mode and active operation mode. The annual ambient temperature profile is taken into account to estimate its impact on the degradation of MOSFETs during the standby mode. At the presence of power outages, the backup system is activated into the operation mode and the MOSFETs withstand additional thermal stresses due to power losses. A study case of a 1 kW backup system is presented with two annual mission profiles in Denmark and India, respectively. The ambient temperature, occurrence frequency of power outages, active operation time and power levels are considered for the lifetime prediction of the applied MOSFETs. Comparisons of the accumulated lifetime consumptions are performed between standby mode and operation mode, and between Denmark and India, respectively.
Original language | English |
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Title of host publication | Proceedings of 2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia) |
Number of pages | 8 |
Publisher | IEEE Press |
Publication date | May 2016 |
Pages | 2798-2805 |
ISBN (Electronic) | 978-1-5090-1210-7 |
DOIs | |
Publication status | Published - May 2016 |
Event | 8th IEEE International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016 - Hefei, China Duration: 22 May 2016 → 26 May 2016 |
Conference
Conference | 8th IEEE International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016 |
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Country/Territory | China |
City | Hefei |
Period | 22/05/2016 → 26/05/2016 |