A Distributed High-Impedance Fault Detection and Protection Scheme in DC Microgrids

Meysam Yadegar, Seyed Fariborz Zarei, Nader Meskin, Frede Blaabjerg

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

This paper proposes a high-impedance fault (HIF) detection and protection scheme for DC microgrids. HIFs occur when a (live) conductor makes contact with a surface which restricts the flow of fault current to a level that cannot be reliably sensed/detected by the conventional relays. HIF detection is an important concern for the electric power grid since it may cause public safety hazards. In this paper, a distributed HIF detection and localization scheme is proposed which considers the inherent HIF arc-characteristics of very low fault current amplitude, nonlinearity, buildup, shoulder, intermittence, and high-frequency content. The proposed scheme effectively identifies the faulty section, and provides forward and reverse fault discrimination capability. To verify the effectiveness of the proposed method, different sets of test cases and experiments are analyzed and presented. In the test cases, the forward/reverse faults and the noise-induced signals are considered and evaluated. Furthermore, detection and localization of both ideal and non-ideal HIFs are evaluated on the test system. The non-ideal HIFs are modeled based on the experimental test waveforms of HIFs. Also, the functionality of the proposed scheme is verified under normal condition with operational changes in a DC microgrid.
Original languageEnglish
Article number10294202
JournalI E E E Transactions on Power Delivery
Volume39
Issue number1
Pages (from-to)141 - 154
Number of pages14
ISSN0885-8977
DOIs
Publication statusPublished - Feb 2024

Keywords

  • DC microgrid
  • distributed fault detection
  • fault localization
  • high-impedance fault

Fingerprint

Dive into the research topics of 'A Distributed High-Impedance Fault Detection and Protection Scheme in DC Microgrids'. Together they form a unique fingerprint.

Cite this