Abstract
In this paper, a new optimal pulsewidth modulation (PWM) scheme for a three-level quasi-switched boost T-type inverter (TL qSBT 2I) under normal and failure modes is proposed. The proposed method reveals its semiconductor fault tolerance capability in open-circuit fault condition situations as described in this paper. The PWM control algorithm for the fault-tolerant qSBT 2I is implemented by selecting appropriate values for the modulation index, shoot-through (ST) duty cycle, and duty cycles of two additional switches. The steady-state analysis and operating principles of the fault-tolerant qSBT 2I are presented. A laboratory prototype was built to verify the operating principles of the qSBT 2I with the proposed modulation scheme before and after fault conditions.
Original language | English |
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Article number | 8736357 |
Journal | IEEE Journal of Emerging and Selected Topics in Power Electronics |
Volume | 8 |
Issue number | 3 |
Pages (from-to) | 3029-3040 |
Number of pages | 12 |
ISSN | 2168-6777 |
DOIs | |
Publication status | Published - Sept 2020 |
Keywords
- Fault tolerance
- Z-source inverter
- Multilevel inverter
- Boost inverter
- Shoot-through
- Single-stage