Accelerated degradation testing and failure phenomenon of metalized film capacitors for AC filtering

Bo Yao, Yichi Zhang, Pedro Correia, Rui Wu, Sungyoung Song, Ionut Trintis, Haoran Wang, Huai Wang

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

1 Citation (Scopus)

Abstract

This paper presents the degradation testing and failure mechanisms analysis of metalized film capacitors used for AC filtering in MW power converters. Based on more than 2,800 hours of accelerated testing under accelerated AC voltage, temperature, and AC current, various electro-thermal parameter data are recorded. The results reveal that capacitance values have negligible reduction until the testing samples catastrophically fail. The capacitor hot spot temperature and case temperature are measured along the testing, which are increasing. The observations provide a new perspective on the possible failure mechanisms and condition monitoring of film capacitors in AC filtering applications.
Original languageEnglish
Title of host publicationAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Number of pages5
PublisherIEEE
Publication dateMar 2023
Pages1846-1850
ISBN (Electronic)9781665475396
DOIs
Publication statusPublished - Mar 2023
Event38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States
Duration: 19 Mar 202323 Mar 2023

Conference

Conference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Country/TerritoryUnited States
CityOrlando
Period19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
SeriesI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Keywords

  • AC filtering
  • MW power converters
  • degradation testing
  • failure mechanism
  • hot spot temperature
  • metalized film capacitors

Fingerprint

Dive into the research topics of 'Accelerated degradation testing and failure phenomenon of metalized film capacitors for AC filtering'. Together they form a unique fingerprint.

Cite this