Application of DE-ELM in analog circuit fault diagnosis

Lihua Zhang, Qi Qin, Yue Shang, Shaowei Chen, Shuai Zhao

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
EditorsQiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
PublisherIEEE Signal Processing Society
Publication date16 Jan 2017
Article number7819874
ISBN (Electronic)9781509027781
DOIs
Publication statusPublished - 16 Jan 2017
Externally publishedYes
Event7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, China
Duration: 19 Oct 201621 Oct 2016

Conference

Conference7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
CountryChina
CityChengdu, Sichuan
Period19/10/201621/10/2016
SeriesProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Keywords

  • Differential evolution
  • Extreme learning machine
  • Fault diagnosis
  • Parameter optimization

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