Benchmarking of Voltage Sag Generators

Yongheng Yang; Frede Blaabjerg; Zhixiang Zou

doi:10.1109/IECON.2012.6389164

Benchmarking of Voltage Sag Generators

Yongheng Yang, Frede Blaabjerg, Zhixiang Zou

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

23 Citations (Scopus)

1313 Downloads (Pure)

Abstract

The increased penetration of renewable energy systems, like photovoltaic and wind power systems, rises the concern about the power quality and stability of the utility grid. Some regulations for Low Voltage Ride-Through (LVRT) for medium voltage or high voltage applications, are coming into force to guide these grid-connected distributed power generation systems. In order to verify the response of such systems for voltage disturbance, mainly for evaluation of voltage sags/dips, a Voltage Sag Generator (VSG) is needed. This paper evaluates such sag test devices according to IEC 61000 in order to provide cheaper solutions to test against voltage sags. Simulation and experimental results demonstrate that the shunt impedance based VSG solution is the easiest and cheapest one for laboratory test applications. The back-to-back fully controlled converter based VSG is the most flexible solution for the system test under grid faults but also the most expensive one.

Original language	English
Title of host publication	the 38th Annual Conference of the IEEE Industrial Electronics Society
Number of pages	6
Place of Publication	Montreal
Publisher	IEEE Press
Publication date	20 Dec 2012
Pages	943-948
ISBN (Print)	978-1-4673-2419-9
ISBN (Electronic)	978-1-4673-2420-5
DOIs	https://doi.org/10.1109/IECON.2012.6389164
Publication status	Published - 20 Dec 2012
Event	the 38th Annual Conference of the IEEE Industrial Electronics Society - ETS, Montreal, Canada Duration: 25 Oct 2012 → 28 Oct 2012

Conference

Conference	the 38th Annual Conference of the IEEE Industrial Electronics Society
Location	ETS
Country/Territory	Canada
City	Montreal
Period	25/10/2012 → 28/10/2012

Series	Proceedings of the Annual Conference of the IEEE Industrial Electronics Society
ISSN	1553-572X

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10.1109/IECON.2012.6389164

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title = "Benchmarking of Voltage Sag Generators",

abstract = "The increased penetration of renewable energy systems, like photovoltaic and wind power systems, rises the concern about the power quality and stability of the utility grid. Some regulations for Low Voltage Ride-Through (LVRT) for medium voltage or high voltage applications, are coming into force to guide these grid-connected distributed power generation systems. In order to verify the response of such systems for voltage disturbance, mainly for evaluation of voltage sags/dips, a Voltage Sag Generator (VSG) is needed. This paper evaluates such sag test devices according to IEC 61000 in order to provide cheaper solutions to test against voltage sags. Simulation and experimental results demonstrate that the shunt impedance based VSG solution is the easiest and cheapest one for laboratory test applications. The back-to-back fully controlled converter based VSG is the most flexible solution for the system test under grid faults but also the most expensive one.",

author = "Yongheng Yang and Frede Blaabjerg and Zhixiang Zou",

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series = "Proceedings of the Annual Conference of the IEEE Industrial Electronics Society",

publisher = "IEEE Press",

pages = "943--948",

booktitle = "the 38th Annual Conference of the IEEE Industrial Electronics Society",

note = "the 38th Annual Conference of the IEEE Industrial Electronics Society ; Conference date: 25-10-2012 Through 28-10-2012",

}

Yang, Y, Blaabjerg, F & Zou, Z 2012, Benchmarking of Voltage Sag Generators. in the 38th Annual Conference of the IEEE Industrial Electronics Society. IEEE Press, Montreal, Proceedings of the Annual Conference of the IEEE Industrial Electronics Society, pp. 943-948, the 38th Annual Conference of the IEEE Industrial Electronics Society, Montreal, Canada, 25/10/2012. https://doi.org/10.1109/IECON.2012.6389164

Benchmarking of Voltage Sag Generators. / Yang, Yongheng; Blaabjerg, Frede; Zou, Zhixiang.
the 38th Annual Conference of the IEEE Industrial Electronics Society. Montreal: IEEE Press, 2012. p. 943-948 (Proceedings of the Annual Conference of the IEEE Industrial Electronics Society).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

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AU - Blaabjerg, Frede

AU - Zou, Zhixiang

PY - 2012/12/20

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N2 - The increased penetration of renewable energy systems, like photovoltaic and wind power systems, rises the concern about the power quality and stability of the utility grid. Some regulations for Low Voltage Ride-Through (LVRT) for medium voltage or high voltage applications, are coming into force to guide these grid-connected distributed power generation systems. In order to verify the response of such systems for voltage disturbance, mainly for evaluation of voltage sags/dips, a Voltage Sag Generator (VSG) is needed. This paper evaluates such sag test devices according to IEC 61000 in order to provide cheaper solutions to test against voltage sags. Simulation and experimental results demonstrate that the shunt impedance based VSG solution is the easiest and cheapest one for laboratory test applications. The back-to-back fully controlled converter based VSG is the most flexible solution for the system test under grid faults but also the most expensive one.

AB - The increased penetration of renewable energy systems, like photovoltaic and wind power systems, rises the concern about the power quality and stability of the utility grid. Some regulations for Low Voltage Ride-Through (LVRT) for medium voltage or high voltage applications, are coming into force to guide these grid-connected distributed power generation systems. In order to verify the response of such systems for voltage disturbance, mainly for evaluation of voltage sags/dips, a Voltage Sag Generator (VSG) is needed. This paper evaluates such sag test devices according to IEC 61000 in order to provide cheaper solutions to test against voltage sags. Simulation and experimental results demonstrate that the shunt impedance based VSG solution is the easiest and cheapest one for laboratory test applications. The back-to-back fully controlled converter based VSG is the most flexible solution for the system test under grid faults but also the most expensive one.

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SN - 978-1-4673-2419-9

T3 - Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

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BT - the 38th Annual Conference of the IEEE Industrial Electronics Society

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ER -

Benchmarking of Voltage Sag Generators

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the 38th Annual Conference of the IEEE Industrial Electronics Society, IECON 2012

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Benchmarking of Voltage Sag Generators

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the 38th Annual Conference of the IEEE Industrial Electronics Society, IECON 2012

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