Original language | English |
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Title of host publication | Extended Abstracts of the V International Conference on Defect Recognizing and Image Processing in Semiconductors and Devices, Vallaloid (Spain), August 21-24, 1993 |
Publication date | 1993 |
Publication status | Published - 1993 |
Influence of Vapor Phase Epitaxy on Large-scale Electrically-active Defect Accumulations in Semiinsulating GaAs Substrates
V. A. Yuryev, V. P. Kalinushkin, A. V. Zayats, Y. A. Repeyev, V. A. Fedoseyev
Research output: Contribution to book/anthology/report/conference proceeding › Book chapter › Research