Influence of Vapor Phase Epitaxy on Large-scale Electrically-active Defect Accumulations in Semiinsulating GaAs Substrates

V. A. Yuryev, V. P. Kalinushkin, A. V. Zayats, Y. A. Repeyev, V. A. Fedoseyev

    Research output: Contribution to book/anthology/report/conference proceedingBook chapterResearch

    Original languageEnglish
    Title of host publicationExtended Abstracts of the V International Conference on Defect Recognizing and Image Processing in Semiconductors and Devices, Vallaloid (Spain), August 21-24, 1993
    Publication date1993
    Publication statusPublished - 1993

    Cite this