Fast Maximum-Power-Point-Tracking for Photovoltaic Systems Based on P-V2Characteristic Curve and Its Stability Analysis

Monchai Ariyapuek*, Surapong Suwankawin, Somboon Sangwongwanich, Ariya Sangwongwanich

*Kontaktforfatter

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

1 Citationer (Scopus)
6 Downloads (Pure)

Abstract

To increase the tracking speed of the photovoltaic system (PV) for dynamic efficiency enhancement, a Maximum-Power-Point-Tracking (MPPT) method based on the P-V2 curve is proposed. In contrast to the traditional design of MPPTs, it is demonstrated that the sampling frequency of MPPT can be increased to achieve an even faster dynamic than the settling time of the dc-voltage control loop as long as the closed-loop MPPT is still stable. Response time of the proposed P-V2 based MPPT can be designed with a much faster dynamic than the conventional MPPT methods while its stability is guaranteed because i) adopting the squared PV voltage makes the dc-voltage control loop linear, and ii) the whole MPPT system conforms to the Lure's systems whose stability can be rigorously analyzed to obtain design guidelines for stable MPPT. Theoretical results are verified by simulation on Matlab/Simulink.

OriginalsprogEngelsk
TitelProceeding of 2022 25th International Conference on Electrical Machines and Systems (ICEMS)
ForlagIEEE
Publikationsdato2022
ISBN (Elektronisk)9781665493024
DOI
StatusUdgivet - 2022
Begivenhed25th International Conference on Electrical Machines and Systems, ICEMS 2022 - Virtual, Online, Thailand
Varighed: 29 nov. 20222 dec. 2022

Konference

Konference25th International Conference on Electrical Machines and Systems, ICEMS 2022
Land/OmrådeThailand
ByVirtual, Online
Periode29/11/202202/12/2022
SponsorAdvanced Info Services Public Company Limited, Revolution Didactic Co., Ltd., Thailand Convention and Exhibition Bureau (TCEB)
NavnInternational Conference on Electrical Machines and Systems (ICEMS)
ISSN2642-5513

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Publisher Copyright:
© 2022 IEEE.

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