Isolation Forest Based Submodule Open-Circuit Fault Localization Method for Modular Multilevel Converters

Fujin Deng, Yufei Chen, Jingming Dou, Chengkai Liu, Zhe Chen, Frede Blaabjerg

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

15 Citationer (Scopus)
67 Downloads (Pure)

Abstract

Fault localization is one of the most important issues for modular multilevel converters (MMCs) consisting of numerous switches. This article proposes an isolation forest (IF) based submodule (SM) switch open-circuit fault localization method for MMCs. Based on the continuous sampling SM capacitor voltages, a number of isolation trees (ITs) are produced to construct the IFs for MMCs. Through the comparison of continuous IFs’ outputs, the faulty SM can be effectively localized. The proposed IF-based fault localization method only requires SM capacitor voltages in the MMC to construct concise low-data-volume tree models, and uses sparsity and difference properties of outlier data to localize fault, and accordingly it simplifies calculation complexity. In addition, it does not require the MMC's mathematical models and manual setting of empirical thresholds. Simulation and experiment are conducted, and the results confirm the effectiveness of proposed method.
OriginalsprogEngelsk
Artikelnummer9760235
TidsskriftI E E E Transactions on Industrial Electronics
Vol/bind70
Udgave nummer3
Sider (fra-til)3090 - 3102
Antal sider13
ISSN0278-0046
DOI
StatusUdgivet - mar. 2023

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