TY - JOUR
T1 - Potential Failure Risk of Fault Location for Modular Multilevel Converters under Light Loads and A Current Reshaping-based Solution
AU - Zhang, Yaqian
AU - Zhang, Yi
AU - Zhang, Jianzhong
AU - Deng, Fujin
AU - Blaabjerg, Frede
PY - 2024/3/1
Y1 - 2024/3/1
N2 - In the state-of-the-art fault location of modular multilevel converters, capacitor voltage deviations between the faulty and healthy submodules are extensively utilized to identify open-circuit faults. However, there is a potential risk of overlooking the ineffectiveness of the fault location under light load conditions. This article presents an analytical model that reveals the fault phenomena and mechanisms specific to light load scenarios. A crucial finding is the strong coupling among faulty arm current, voltage deviations between faulty and healthy submodules, and load conditions. Ignoring this effect can result in underperformance of the fault location, such as seriously delayed detection or missing detection. To address this issue, a current-reshaping-based solution is proposed to ensure optimal fault location performance across the full power range. The effectiveness of the proposed analysis and method is validated through simulations and a downscale experimental platform.
AB - In the state-of-the-art fault location of modular multilevel converters, capacitor voltage deviations between the faulty and healthy submodules are extensively utilized to identify open-circuit faults. However, there is a potential risk of overlooking the ineffectiveness of the fault location under light load conditions. This article presents an analytical model that reveals the fault phenomena and mechanisms specific to light load scenarios. A crucial finding is the strong coupling among faulty arm current, voltage deviations between faulty and healthy submodules, and load conditions. Ignoring this effect can result in underperformance of the fault location, such as seriously delayed detection or missing detection. To address this issue, a current-reshaping-based solution is proposed to ensure optimal fault location performance across the full power range. The effectiveness of the proposed analysis and method is validated through simulations and a downscale experimental platform.
KW - Behavioral sciences
KW - Capacitors
KW - Circuit faults
KW - Current injection
KW - Electric potential
KW - Fault location
KW - Light load condition
KW - Modular multilevel converter (MMC)
KW - Multilevel converters
KW - Open-circuit fault location
KW - Voltage
UR - http://www.scopus.com/inward/record.url?scp=85182384113&partnerID=8YFLogxK
U2 - 10.1109/TPEL.2023.3344268
DO - 10.1109/TPEL.2023.3344268
M3 - Journal article
SN - 1941-0107
VL - 39
SP - 3601
EP - 3612
JO - IEEE Transactions on Power Electronics
JF - IEEE Transactions on Power Electronics
IS - 3
M1 - 10365233
ER -