Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation

Yubo Song; Subham Sahoo; Yongheng Yang; Frede Blaabjerg

doi:10.23919/EPE23ECCEEurope58414.2023.10264295

Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation

Yubo Song, Subham Sahoo, Yongheng Yang, Frede Blaabjerg

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

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Abstract

Stability and reliability are vital performance metrics for microgrid systems, while their interdependency on each other has not been well addressed. This paper thereby explains the relationships between them from a conditional perspective using the Bayesian inference, where the observed stability performance influences the evaluation of system reliability. A DC-AC converter system considering the degradation of filter capacitors is exemplified to illustrate the reliability under stability conditions, with simulation and experimental results provided in order to demonstrate the basic idea.

Originalsprog	Engelsk
Titel	Proceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Antal sider	8
Forlag	IEEE
Publikationsdato	8 sep. 2023
Sider	1-8
Artikelnummer	10264295
ISBN (Trykt)	979-8-3503-1678-0
ISBN (Elektronisk)	978-9-0758-1541-2
DOI	https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264295
Status	Udgivet - 8 sep. 2023
Begivenhed	2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) - Aalborg, Danmark Varighed: 4 sep. 2023 → 8 sep. 2023

Konference

Konference	2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Land/Område	Danmark
By	Aalborg
Periode	04/09/2023 → 08/09/2023

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10.23919/EPE23ECCEEurope58414.2023.10264295

Probabilistic Mapping of Stability and Reliability in Microgrids - A Bayesian InterpretationAccepteret manuskript, 740 KBLicens: CC BY 4.0

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STABILITY AND RELIABILITY VALIDATION OF A MICROGRID SYSTEM
Song, Y., Blaabjerg, F., Yang, Y. & Sahoo, S.
01/06/2020 → 31/05/2023
Projekter: Projekt › Ph.d.-projekt
REPEPS: REliable Power Electronic based Power System
Blaabjerg, F., Iannuzzo, F., Davari, P., Wang, H., Wang, X. & Yang, Y.
01/08/2017 → 01/12/2023
Projekter: Projekt › Forskning

Citationsformater

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title = "Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation",

abstract = "Stability and reliability are vital performance metrics for microgrid systems, while their interdependency on each other has not been well addressed. This paper thereby explains the relationships between them from a conditional perspective using the Bayesian inference, where the observed stability performance influences the evaluation of system reliability. A DC-AC converter system considering the degradation of filter capacitors is exemplified to illustrate the reliability under stability conditions, with simulation and experimental results provided in order to demonstrate the basic idea.",

keywords = "Capacitors, Degradation, Europe, Microgrids, Probabilistic logic, Stability analysis, System performance, Reliability, DC-AC converter",

author = "Yubo Song and Subham Sahoo and Yongheng Yang and Frede Blaabjerg",

year = "2023",

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doi = "10.23919/EPE23ECCEEurope58414.2023.10264295",

language = "English",

isbn = "979-8-3503-1678-0",

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booktitle = "Proceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)",

publisher = "IEEE",

address = "United States",

note = "2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) ; Conference date: 04-09-2023 Through 08-09-2023",

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Song, Y , Sahoo, S, Yang, Y & Blaabjerg, F 2023, Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation. i Proceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)., 10264295, IEEE, s. 1-8, 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe), Aalborg, Danmark, 04/09/2023. https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264295

Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation. / Song, Yubo ; Sahoo, Subham; Yang, Yongheng et al.
Proceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe). IEEE, 2023. s. 1-8 10264295.

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Probabilistic Mapping of Stability and Reliability in Microgrids

T2 - 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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AU - Yang, Yongheng

AU - Blaabjerg, Frede

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Y1 - 2023/9/8

N2 - Stability and reliability are vital performance metrics for microgrid systems, while their interdependency on each other has not been well addressed. This paper thereby explains the relationships between them from a conditional perspective using the Bayesian inference, where the observed stability performance influences the evaluation of system reliability. A DC-AC converter system considering the degradation of filter capacitors is exemplified to illustrate the reliability under stability conditions, with simulation and experimental results provided in order to demonstrate the basic idea.

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KW - Capacitors

KW - Degradation

KW - Europe

KW - Microgrids

KW - Probabilistic logic

KW - Stability analysis

KW - System performance

KW - Reliability

KW - DC-AC converter

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M3 - Article in proceeding

SN - 979-8-3503-1678-0

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BT - Proceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

PB - IEEE

Y2 - 4 September 2023 through 8 September 2023

ER -

Probabilistic Mapping of Stability and Reliability in Microgrids: A Bayesian Interpretation

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STABILITY AND RELIABILITY VALIDATION OF A MICROGRID SYSTEM

REPEPS: REliable Power Electronic based Power System

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