Reliability of WBG, results of a Pre-Scoping Study

Kaichen Zhang; Francesco Iannuzzo; Christian Holm  Christiansen

doi:10.23919/EPE23ECCEEurope58414.2023.10264334

Reliability of WBG, results of a Pre-Scoping Study

Kaichen Zhang^*, Francesco Iannuzzo, Christian Holm Christiansen

^*Kontaktforfatter

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

Abstract

This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.

Originalsprog	Engelsk
Titel	2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe
Forlag	IEEE
Publikationsdato	2023
Artikelnummer	10264334
ISBN (Elektronisk)	9789075815412
DOI	https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264334
Status	Udgivet - 2023
Begivenhed	25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe - Aalborg, Danmark Varighed: 4 sep. 2023 → 8 sep. 2023

Konference

Konference	25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe
Land/Område	Danmark
By	Aalborg
Periode	04/09/2023 → 08/09/2023

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10.23919/EPE23ECCEEurope58414.2023.10264334

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@inproceedings{d389a125a7f4451cb2ddec776d7f6cd2,

title = "Reliability of WBG, results of a Pre-Scoping Study",

abstract = "This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.",

keywords = "Device application, Gallium Nitride (GaN), Reliability, Silicon Carbide (SiC), Wide bandgap",

author = "Kaichen Zhang and Francesco Iannuzzo and Christiansen, {Christian Holm}",

year = "2023",

doi = "10.23919/EPE23ECCEEurope58414.2023.10264334",

language = "English",

booktitle = "2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe",

publisher = "IEEE",

address = "United States",

note = "25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe ; Conference date: 04-09-2023 Through 08-09-2023",

}

Zhang, K , Iannuzzo, F & Christiansen, CH 2023, Reliability of WBG, results of a Pre-Scoping Study. i 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe., 10264334, IEEE, 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe, Aalborg, Danmark, 04/09/2023. https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264334

TY - GEN

T1 - Reliability of WBG, results of a Pre-Scoping Study

AU - Zhang, Kaichen

AU - Iannuzzo, Francesco

AU - Christiansen, Christian Holm

PY - 2023

Y1 - 2023

N2 - This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.

AB - This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.

KW - Device application

KW - Gallium Nitride (GaN)

KW - Reliability

KW - Silicon Carbide (SiC)

KW - Wide bandgap

UR - http://www.scopus.com/inward/record.url?scp=85175163182&partnerID=8YFLogxK

U2 - 10.23919/EPE23ECCEEurope58414.2023.10264334

DO - 10.23919/EPE23ECCEEurope58414.2023.10264334

M3 - Article in proceeding

BT - 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe

PB - IEEE

T2 - 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe

Y2 - 4 September 2023 through 8 September 2023

ER -

Reliability of WBG, results of a Pre-Scoping Study

Abstract

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