A review on IGBT module failure modes and lifetime testing

Ahmed Abuelnaga*, Mehdi Narimani, Amir Sajjad Bahman

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

85 Citations (Scopus)
629 Downloads (Pure)

Abstract

This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details.

Original languageEnglish
Article number9316255
JournalIEEE Access
Volume9
Pages (from-to)9643-9663
Number of pages21
ISSN2169-3536
DOIs
Publication statusPublished - 2021

Bibliographical note

Publisher Copyright:
© 2013 IEEE.

Keywords

  • degradation
  • IGBT failure modes
  • lifetime models
  • Long-term reliability
  • power cycling

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