Current measurement method for characterization of fast switching power semiconductors with Silicon Steel Current Transformer

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26 Citations (Scopus)

Abstract

This paper proposes a novel current measurement method with Silicon Steel Current Transformer (SSCT) for the characterization of fast switching power semiconductors. First, the existing current sensors for characterization of fast switching power semiconductors are experimentally evaluated regarding three essential qualities: high bandwidth, suitable physical size, and galvanic isolation. Then, the proposed current measurement method with SSCT is mathematically analyzed, which proves that the proposed method has the capability of measuring fast switching current. Simultaneously, it compensates the mechanical size limitations of the Pearson current monitor. Finally, experimental studied are carried out with both discrete Silicon Carbide (SiC) MOSFET and high current (1000A) Silicon (Si) IGBT power modules. The experimental results validate the effectiveness of the proposed method.
Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages5
PublisherIEEE Press
Publication dateMar 2015
Pages2527 - 2531
ISBN (Print)978-1-4799-6735-3
DOIs
Publication statusPublished - Mar 2015
Event30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 - Charlotte, United States
Duration: 15 Mar 201519 Mar 2015

Conference

Conference30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015
Country/TerritoryUnited States
CityCharlotte
Period15/03/201519/03/2015
SeriesI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Keywords

  • Current transformers
  • Electric current measurement
  • Elemental semiconductors
  • Insulated gate bipolar transistors
  • Power MOSFET
  • Power bipolar transistors
  • Silicon
  • Silicon compounds
  • Wide band gap semiconductors

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